DALIENTO, SANTOLO
DALIENTO, SANTOLO
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
Modelling of the input I-V curves of bipolar JFET structures showing a negative resistance behaviour
2001 S., Bellone; Daliento, Santolo; A., Sanseverino
A Measurement Method of the Ideal I-V Characteristic of Diodes Up to the Built-in Voltage Limit
1999 S., Bellone; Daliento, Santolo; A., Sanseverino
An Improved Test Structure for Recombination Lifetime Profile Measurements in Very Thick Silicon Wafers
1999 Daliento, Santolo; A., Sanseverino; P., Spirito
An electrical technique for the measurement of the interface recombination velocity based on a three terminal test structu
2003 Daliento, Santolo; A., Sanseverino; P., Spirito; F., Roca
Parametric Description on the Effect on Electron Irradiation on Recombination Lifetime in Silicon Layer: An Experimental Approach
1999 Daliento, Santolo; A., Sanseverino; P., Spirito; L., Zeni
Comments on :Minority Carrier Lifetime Measurements in Epitaxial Silicon Layers
1998 P., Spirito; Daliento, Santolo; A., Sanseverino
Two Dimensional Analysis of a Test Structure for Lifetime Profile Measurements
1995 Daliento, Santolo; N., Rinaldi; A., Sanseverino; P., Spirito
Approximate closed form analytical solution for minority carrier transport in opaque heavily doped regions under illuminated conditions
2006 Daliento, Santolo; L., Mele
Experimental Measurements of Majority and Minority Carrier Lifetime Profile in SI Epilayers by the Use of an Improved OCVD Method
2005 S., Bellone; G. D., Licciardo; Daliento, Santolo; L., Mele
Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the ac profiling technique
2004 Spirito, Paolo; Daliento, Santolo; A., Sanseverino; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo
Analytical modelling and minority current measurements for the determination of the emitter surface recombination velocity in silicon solar cells
2007 Daliento, Santolo; Mele, L; Bobeico, E; Lancellotti, L; Morvillo, P.
Recombination Centers Identification in Very Thin Silicon Epitaxial Layers via Lifetime Measurements
1996 Daliento, Santolo; A., Sanseverino; P. M., Sarro; P., Spirito; L., Zeni
Recombination Lifetime Measurements in Silicon
1994 P., Spirito; Daliento, Santolo; A., Sanseverino
An Optical Technique to Measure the Bulk Lifetime and the Surface Recombination Velocity in Silicon Samples Based on a Laser Diode Probe System
1998 A., Cutolo; Daliento, Santolo; A., Sanseverino; G. F., Vitale; L., Zeni
Comments on: Temperature Dependence of Carrier Lifetime in Si wafer
1999 P., Spirito; Daliento, Santolo; A., Sanseverino; L., Zeni
An Improved Model for the Extraction of Strongly Spatial Dependent Lifetimes with a.c. Lifetime Profiling Technique
1999 Daliento, Santolo; A., Sanseverino; P., Spirito
Numerical analysis of the series resistance in concentration sola cells
2009 Daliento, Santolo; Guerriero, Pierluigi; L., Lancellotti; R., Fucci
Approximate analysis of optical properties for ZnO rough surfaces
2014 Daliento, Santolo; Guerriero, Pierluigi; M., Addonizio; A., Antonaia
Refractive index measurement in TCO layers for micro optoelectronic devices
2014 Daliento, Santolo; Guerriero, Pierluigi; M., Addonizio; A., Antonaia; E., Gambale
A PV AC-module based on coupled-inductors boost DC/AC converter
2014 Coppola, Marino; Guerriero, Pierluigi; DI NAPOLI, Fabio; Daliento, Santolo; Lauria, Davide; DEL PIZZO, Andrea