DALIENTO, SANTOLO
DALIENTO, SANTOLO
Dipartimento di Ingegneria elettrica e delle Tecnologie dell'Informazione
Two Dimensional Analysis of a Test Structure for Lifetime Profile Measurements
1995 Daliento, Santolo; N., Rinaldi; A., Sanseverino; P., Spirito
Experimental Measurements of Majority and Minority Carrier Lifetime Profile in SI Epilayers by the Use of an Improved OCVD Method
2005 S., Bellone; G. D., Licciardo; Daliento, Santolo; L., Mele
Approximate closed form analytical solution for minority carrier transport in opaque heavily doped regions under illuminated conditions
2006 Daliento, Santolo; L., Mele
Analytical modelling and minority current measurements for the determination of the emitter surface recombination velocity in silicon solar cells
2007 Daliento, Santolo; Mele, L; Bobeico, E; Lancellotti, L; Morvillo, P.
Induced degradation on c-Si solar cells for concentration terrestrial applications
2010 L., Lancellotti; R., Fucci; A., Romano; A., Sarno; Daliento, Santolo
Two dimensional analysis of a test structure for lifetime profile measurements
1995 Daliento, Santolo; Rinaldi, Niccolo'; Sanseverino, Annunziata; P., Spirito
Experimental measurements of recombination lifetime in proton irradiated power devices
2000 Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss
An Improved Test Structure for Recombination Lifetime Profile Measurements in Very Thick Silicon Wafers
1999 Daliento, Santolo; A., Sanseverino; P., Spirito
Recombination Centers Identification in Very Thin Silicon Epitaxial Layers via Lifetime Measurements
1996 Daliento, Santolo; A., Sanseverino; P. M., Sarro; P., Spirito; L., Zeni
An Optical Technique to Measure the Bulk Lifetime and the Surface Recombination Velocity in Silicon Samples Based on a Laser Diode Probe System
1998 A., Cutolo; Daliento, Santolo; A., Sanseverino; G. F., Vitale; L., Zeni
Experimental study on power consumption in lifetime engineered power diodes
2009 Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin
Circuito per il bypass attivo di sotto-pannelli fotovoltaici basato su un transistore bipolare operante in saturazione
2012 D'Alessandro, Vincenzo; Daliento, Santolo; Matteo, Gargiulo; Guerriero, Pierluigi
Sol-gel Synthesis of ZnO thin films for photovoltaic applications
2012 Tari, Orlando; Aronne, Antonio; M. L., Addonizio; Daliento, Santolo; Fanelli, Esther; Pernice, Pasquale
Sol-Gel Preparation of Nanostructured Aluminum doped ZnO (AZO) Thin Films for Photovoltaic Applications
2011 Tari, Orlando; Fanelli, Esther; M. L., Addonizio; Aronne, Antonio; Daliento, Santolo; Pernice, Pasquale
Raoid-thermal-annealing in forming gas ambient for high efficiency C-Si solar cells passivation oxides
2009 Daliento, Santolo; L., Lancellotti; S., Gnanapragasam; G., Giudicianni; F., Formisano; Guerriero, Pierluigi; E., Bobeico; P., Morvillo; R., Fucci; F., Roca
Direct measurement of the surface recombination velocity by means of a special test device
2009 Daliento, Santolo; M., Costagliola
3D Analysis of silicon solar cells for the optimum design of concentration devices
2008 Daliento, Santolo; L., Mele
Modelling of the input I-V curves of bipolar JFET structures showing a negative resistance behaviour
2001 S., Bellone; Daliento, Santolo; A., Sanseverino
An Improved Model for the Extraction of Strongly Spatial Dependent Lifetimes with a.c. Lifetime Profiling Technique
1999 Daliento, Santolo; A., Sanseverino; P., Spirito
Bulk lifetime extraction in silicon wafers: comparison between electrical and optical techniques
1997 Cutolo, A.; Daliento, Santolo; Irace, Andrea; Sanseverino, A.; Spirito, P.; Zeni, L.
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
Two Dimensional Analysis of a Test Structure for Lifetime Profile Measurements | 1.1 Articolo in rivista | 1995 | Daliento, Santolo; N., Rinaldi; A., Sanseverino; P., Spirito | |
Experimental Measurements of Majority and Minority Carrier Lifetime Profile in SI Epilayers by the Use of an Improved OCVD Method | 1.1 Articolo in rivista | 2005 | S., Bellone; G. D., Licciardo; Daliento, Santolo; L., Mele | |
Approximate closed form analytical solution for minority carrier transport in opaque heavily doped regions under illuminated conditions | 1.1 Articolo in rivista | 2006 | Daliento, Santolo; L., Mele | |
Analytical modelling and minority current measurements for the determination of the emitter surface recombination velocity in silicon solar cells | 1.1 Articolo in rivista | 2007 | Daliento, Santolo; Mele, L; Bobeico, E; Lancellotti, L; Morvillo, P. | |
Induced degradation on c-Si solar cells for concentration terrestrial applications | 1.1 Articolo in rivista | 2010 | L., Lancellotti; R., Fucci; A., Romano; A., Sarno; Daliento, Santolo | |
Two dimensional analysis of a test structure for lifetime profile measurements | 1.1 Articolo in rivista | 1995 | Daliento, Santolo; Rinaldi, Niccolo'; Sanseverino, Annunziata; P., Spirito | |
Experimental measurements of recombination lifetime in proton irradiated power devices | 4.1 Articoli in Atti di convegno | 2000 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss | |
An Improved Test Structure for Recombination Lifetime Profile Measurements in Very Thick Silicon Wafers | 1.1 Articolo in rivista | 1999 | Daliento, Santolo; A., Sanseverino; P., Spirito | |
Recombination Centers Identification in Very Thin Silicon Epitaxial Layers via Lifetime Measurements | 1.1 Articolo in rivista | 1996 | Daliento, Santolo; A., Sanseverino; P. M., Sarro; P., Spirito; L., Zeni | |
An Optical Technique to Measure the Bulk Lifetime and the Surface Recombination Velocity in Silicon Samples Based on a Laser Diode Probe System | 1.1 Articolo in rivista | 1998 | A., Cutolo; Daliento, Santolo; A., Sanseverino; G. F., Vitale; L., Zeni | |
Experimental study on power consumption in lifetime engineered power diodes | 1.1 Articolo in rivista | 2009 | Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin | |
Circuito per il bypass attivo di sotto-pannelli fotovoltaici basato su un transistore bipolare operante in saturazione | 6.1 Brevetto | 2012 | D'Alessandro, Vincenzo; Daliento, Santolo; Matteo, Gargiulo; Guerriero, Pierluigi | |
Sol-gel Synthesis of ZnO thin films for photovoltaic applications | 4.1 Articoli in Atti di convegno | 2012 | Tari, Orlando; Aronne, Antonio; M. L., Addonizio; Daliento, Santolo; Fanelli, Esther; Pernice, Pasquale | |
Sol-Gel Preparation of Nanostructured Aluminum doped ZnO (AZO) Thin Films for Photovoltaic Applications | 4.1 Articoli in Atti di convegno | 2011 | Tari, Orlando; Fanelli, Esther; M. L., Addonizio; Aronne, Antonio; Daliento, Santolo; Pernice, Pasquale | |
Raoid-thermal-annealing in forming gas ambient for high efficiency C-Si solar cells passivation oxides | 4.1 Articoli in Atti di convegno | 2009 | Daliento, Santolo; L., Lancellotti; S., Gnanapragasam; G., Giudicianni; F., Formisano; Guerriero, Pierluigi; E., Bobeico; P., Morvillo; R., Fucci; F., Roca | |
Direct measurement of the surface recombination velocity by means of a special test device | 4.1 Articoli in Atti di convegno | 2009 | Daliento, Santolo; M., Costagliola | |
3D Analysis of silicon solar cells for the optimum design of concentration devices | 4.1 Articoli in Atti di convegno | 2008 | Daliento, Santolo; L., Mele | |
Modelling of the input I-V curves of bipolar JFET structures showing a negative resistance behaviour | 1.1 Articolo in rivista | 2001 | S., Bellone; Daliento, Santolo; A., Sanseverino | |
An Improved Model for the Extraction of Strongly Spatial Dependent Lifetimes with a.c. Lifetime Profiling Technique | 1.1 Articolo in rivista | 1999 | Daliento, Santolo; A., Sanseverino; P., Spirito | |
Bulk lifetime extraction in silicon wafers: comparison between electrical and optical techniques | 4.1 Articoli in Atti di convegno | 1997 | Cutolo, A.; Daliento, Santolo; Irace, Andrea; Sanseverino, A.; Spirito, P.; Zeni, L. |