SPIRITO, PAOLO
SPIRITO, PAOLO
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
A novel time-domain processor for real time SAR operation
1998 Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro
Electrical measurement of the lattice damage induced by a-particle implantation in silicon
2005 L., Bellemo; R., Carta; Daliento, Santolo; L., Gialanella; B. N., Limata; L., Mele; Romano, Mario; A., Sanseverino; Spirito, Paolo
New developments of THERMOS3, a tool for 3D electroTHERmal simulation of smart power MOSfets
2007 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell
2007 Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta
Experimental measurement of in-depth secondary defect distribution prodced by Helium implantation in silicon
2006 Daliento, Santolo; Mele, L.; Spirito, Paolo; Gialanella, Lucio; Limata, BENEDICTA NORMANNA; Romano, Mario
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation
2005 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; R., Letor; S., Russo
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode
2006 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; A., Bricconi; D., Raffo; L., Merlin
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching
2004 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; E., D'Arcangelo
An experimental analysis of localized lifetime and resistivity control by helium implant in Si
2005 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo
Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect
2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
A novel test structure for the measurement of the multiplication coefficient in silicon
1998 Daliento, Santolo; A., Sanseverino; Spirito, Paolo
He voids lifetime control compared with buffer-layer engineering for a 600V punch-through IGBT
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
TherMos3: a 3D electrothermal simulator for smart Power Devices
2006 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Single Chip Implementation of 600V IGBT and Freewheeling Diode
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
Design of a 600V Punch-through IGBT using local lifetime control. On-state voltage drop vs. turn-off time optimization.
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
Experimental measurements of recombination lifetime in proton irradiated power devices
2000 Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss
A new test structure for lifetime profiling in very thick lightly doped silicon material
1998 Daliento, Santolo; A., Sanseverino; Spirito, Paolo
Educational issues for power semiconductor devices (invited paper)
1996 Spirito, Paolo
The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results
1996 Breglio, Giovanni; R., Casavola; A., Cutolo; Spirito, Paolo
Design criteria for PiN diode using multiple He ion implantation for local lifetime control
1999 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
A novel time-domain processor for real time SAR operation | 4.1 Articoli in Atti di convegno | 1998 | Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro | |
Electrical measurement of the lattice damage induced by a-particle implantation in silicon | 1.1 Articolo in rivista | 2005 | L., Bellemo; R., Carta; Daliento, Santolo; L., Gialanella; B. N., Limata; L., Mele; Romano, Mario; A., Sanseverino; Spirito, Paolo | |
New developments of THERMOS3, a tool for 3D electroTHERmal simulation of smart power MOSfets | 1.1 Articolo in rivista | 2007 | Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell | 1.1 Articolo in rivista | 2007 | Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta | |
Experimental measurement of in-depth secondary defect distribution prodced by Helium implantation in silicon | 1.1 Articolo in rivista | 2006 | Daliento, Santolo; Mele, L.; Spirito, Paolo; Gialanella, Lucio; Limata, BENEDICTA NORMANNA; Romano, Mario | |
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation | 1.1 Articolo in rivista | 2005 | Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; R., Letor; S., Russo | |
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode | 1.1 Articolo in rivista | 2006 | Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; A., Bricconi; D., Raffo; L., Merlin | |
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching | 1.1 Articolo in rivista | 2004 | Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; E., D'Arcangelo | |
An experimental analysis of localized lifetime and resistivity control by helium implant in Si | 4.1 Articoli in Atti di convegno | 2005 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo | |
Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect | 4.1 Articoli in Atti di convegno | 2006 | Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
A novel test structure for the measurement of the multiplication coefficient in silicon | 4.1 Articoli in Atti di convegno | 1998 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo | |
He voids lifetime control compared with buffer-layer engineering for a 600V punch-through IGBT | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
TherMos3: a 3D electrothermal simulator for smart Power Devices | 4.1 Articoli in Atti di convegno | 2006 | Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
Single Chip Implementation of 600V IGBT and Freewheeling Diode | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
Design of a 600V Punch-through IGBT using local lifetime control. On-state voltage drop vs. turn-off time optimization. | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
Experimental measurements of recombination lifetime in proton irradiated power devices | 4.1 Articoli in Atti di convegno | 2000 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss | |
A new test structure for lifetime profiling in very thick lightly doped silicon material | 4.1 Articoli in Atti di convegno | 1998 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo | |
Educational issues for power semiconductor devices (invited paper) | 1.1 Articolo in rivista | 1996 | Spirito, Paolo | |
The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results | 1.1 Articolo in rivista | 1996 | Breglio, Giovanni; R., Casavola; A., Cutolo; Spirito, Paolo | |
Design criteria for PiN diode using multiple He ion implantation for local lifetime control | 4.1 Articoli in Atti di convegno | 1999 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo |