In this work we aim to realize a step-by-step electro-optical probe which exploits the linear (Pockels) electro-optic effect to survey the electromagnetic field on the surface of RF integrated circuits. This probe measures the variation of light polarization induced by a lithium niobate crystal immersed in the electric field provided by the DUT. The measurements will demonstrate the main features of this system which can be summarized in non-invasiveness, wide bandwidth, linearity and small spatial resolution. The LiNbO3 crystals have been developed by SELEX Sistemi Integrati S.p.A. Roma, and the whole research activity has been carried out under the sponsorship of the CRdC Nuove Tecnologie per le Attivita Produttive, the Campania Region Centre of Competence on New Technologies.
Development of an Electro-Optic step-by-step Sampling System for ICs Close Electro-Magnetic Field Measurement / Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo. - STAMPA. - 6189:(2006), pp. 100-104. (Intervento presentato al convegno SPIE Photonics Europe 2006 tenutosi a Strasbourg, France nel 28-30 June, 2006.) [10.1117/12.662043].
Development of an Electro-Optic step-by-step Sampling System for ICs Close Electro-Magnetic Field Measurement
ROSSI, LUCIO;BREGLIO, GIOVANNI;IRACE, ANDREA;SPIRITO, PAOLO
2006
Abstract
In this work we aim to realize a step-by-step electro-optical probe which exploits the linear (Pockels) electro-optic effect to survey the electromagnetic field on the surface of RF integrated circuits. This probe measures the variation of light polarization induced by a lithium niobate crystal immersed in the electric field provided by the DUT. The measurements will demonstrate the main features of this system which can be summarized in non-invasiveness, wide bandwidth, linearity and small spatial resolution. The LiNbO3 crystals have been developed by SELEX Sistemi Integrati S.p.A. Roma, and the whole research activity has been carried out under the sponsorship of the CRdC Nuove Tecnologie per le Attivita Produttive, the Campania Region Centre of Competence on New Technologies.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
