Sfoglia per Autore
Model-order reduction procedure for fast dynamic electrothermal simulation of power converters
2019 Catalano, ANTONIO PIO; Riccio, Michele; Codecasa, Lorenzo; Magnani, Alessandro; Romano, Gianpaolo; D'Alessandro, Vincenzo; Maresca, Luca; Rinaldi, Niccolo'; Breglio, Giovanni; Irace, Andrea
Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources
2018 Codecasa, Lorenzo; Bornoff, Robin; Dyson, James; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'
Reliability
2018 D'Alessandro, Vincenzo; Maneux, Cristell; Fischer, Gerhard G.; Aufinger, Klaus; Magnani, Alessandro; Russo, Salvatore; Rinaldi, Niccolo'
Analysis of electrothermal and impact-ionization effects in bipolar cascode amplifiers
2018 D'Alessandro, Vincenzo; D’Esposito, Rosario; Metzger, Andre G.; Kwok, Kai H.; Aufinger, Klaus; Zimmer, Thomas; Rinaldi, Niccolo'
Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization
2018 Rogié, Brice; Codecasa, Lorenzo; Monier-Vinard, Eric; Bissuel, Valentin; Laraqi, Najib; Daniel, Oliver; D’Amore, Dario; Magnani, Alessandro; D'Alessandro, Vincenzo; Rinaldi, Niccolo'
Effect of heat sources modeling in DC circuit-level electrothermal simulation of power MOSFETs
2017 Catalano, ANTONIO PIO; D'Alessandro, Vincenzo; Romano, Gianpaolo; Riccio, Michele; Magnani, Alessandro; Codecasa, Lorenzo; Rinaldi, Niccolo'; Irace, Andrea; Breglio, Giovanni
Si/SiGe:C and InP/GaAsSb heterojunction bipolar transistors for THz applications
2017 Chevalier, Pascal; Schroeter, Michael; Bolognesi, Colombo R.; D'Alessandro, Vincenzo; Alexandrova, Maria; Boeck, Josef; Fluckinger, Ralf; Frégonèse, Sebastien; Heinemann, Bernd; Jungemann, Christoph; Lovblom, Rickard; Maneux, Cristell; Ostinelli, Olivier; Pawlak, Andreas; Rinaldi, Niccolo'; Rucker, Holger; Wedel, Gerald; Zimmer, Thomas
Delphi-like dynamical compact thermal models using model order reduction
2017 Rogié, Brice; Codecasa, Lorenzo; Monier-Vinard, Eric; Bissuel, Valentin; Laraqi, Najib; Daniel, Olivier; D'Amore, Dario; Magnani, Alessandro; D'Alessandro, Vincenzo; Rinaldi, Niccolo'
Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies
2017 D'Alessandro, Vincenzo; Catalano, ANTONIO PIO; Magnani, Alessandro; Codecasa, Lorenzo; Rinaldi, Niccolo'; Moser, Brian; Zampardi, Peter J.
Novel approach for the extraction of nonlinear compact thermal models
2017 Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'
Fast nonlinear dynamic compact thermal modeling with multiple heat sources in Ultra-Thin Chip Stacking Technology
2017 Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'
Connecting MOR-based boundary condition independent compact thermal models
2017 Codecasa, Lorenzo; Bornoff, Robin; Dyson, James; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'
Numerical analysis of the thermal behavior sensitivity to technology parameters and operating conditions in InGaP/GaAs HBTs
2017 Catalano, ANTONIO PIO; Magnani, Alessandro; D'Alessandro, Vincenzo; Codecasa, Lorenzo; Rinaldi, Niccolo'; Moser, Brian; Zampardi, Peter J.
Partition-based approach to parametric dynamic compact thermal modeling
2017 Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'; Metzger, Andre G.; Bornoff, Robin; Parry, John
Influence of layout and technology parameters on the thermal behavior of InGaP/GaAs HBTs
2017 Catalano, ANTONIO PIO; Magnani, Alessandro; D'Alessandro, Vincenzo; Codecasa, Lorenzo; Zampardi, Peter J.; Moser, Brian; Rinaldi, Niccolo'
Microscopic hot-carrier degradation modeling of SiGe HBTs under stress conditions close to the SOA limit
2017 Kamrani, Hamed; Jabs, Dominic; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Jacquet, Thomas; Maneux, Cristell; Zimmer, Thomas; Aufinger, Klaus; Jungemann, Christoph
A deterministic and self-consistent solver for the coupled carrier-phonon system in SiGe HBTs
2017 Kamrani, Hamed; Jabs, Dominic; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Aufinger, Klaus; Jungemann, Christoph
3-D thermal models calibration by parametric dynamic compact thermal models
2017 Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'
Physics-based hot-carrier degradation model for SiGe HBTs
2016 Hamed, Kamrani; Dominic, Jabs; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Christoph, Jungemann
Novel MOR approach for extracting dynamic compact thermal models with massive numbers of heat sources
2016 Lorenzo, Codecasa; Magnani, Alessandro; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Andre G., Metzger; John D., Parry; Robin B., Bornoff
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
Model-order reduction procedure for fast dynamic electrothermal simulation of power converters | 2.1 Contributo in volume (Capitolo o Saggio) | 2019 | Catalano, ANTONIO PIO; Riccio, Michele; Codecasa, Lorenzo; Magnani, Alessandro; Romano, Gianpaolo; D'Alessandro, Vincenzo; Maresca, Luca; Rinaldi, Niccolo'; Breglio, Giovanni; Irace, Andrea | |
Versatile MOR-based boundary condition independent compact thermal models with multiple heat sources | 1.1 Articolo in rivista | 2018 | Codecasa, Lorenzo; Bornoff, Robin; Dyson, James; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo' | |
Reliability | 2.1 Contributo in volume (Capitolo o Saggio) | 2018 | D'Alessandro, Vincenzo; Maneux, Cristell; Fischer, Gerhard G.; Aufinger, Klaus; Magnani, Alessandro; Russo, Salvatore; Rinaldi, Niccolo' | |
Analysis of electrothermal and impact-ionization effects in bipolar cascode amplifiers | 1.1 Articolo in rivista | 2018 | D'Alessandro, Vincenzo; D’Esposito, Rosario; Metzger, Andre G.; Kwok, Kai H.; Aufinger, Klaus; Zimmer, Thomas; Rinaldi, Niccolo' | |
Multi-port dynamic compact thermal models of dual-chip package using model order reduction and metaheuristic optimization | 1.1 Articolo in rivista | 2018 | Rogié, Brice; Codecasa, Lorenzo; Monier-Vinard, Eric; Bissuel, Valentin; Laraqi, Najib; Daniel, Oliver; D’Amore, Dario; Magnani, Alessandro; D'Alessandro, Vincenzo; Rinaldi, Niccolo' | |
Effect of heat sources modeling in DC circuit-level electrothermal simulation of power MOSFETs | 4.1 Articoli in Atti di convegno | 2017 | Catalano, ANTONIO PIO; D'Alessandro, Vincenzo; Romano, Gianpaolo; Riccio, Michele; Magnani, Alessandro; Codecasa, Lorenzo; Rinaldi, Niccolo'; Irace, Andrea; Breglio, Giovanni | |
Si/SiGe:C and InP/GaAsSb heterojunction bipolar transistors for THz applications | 1.1 Articolo in rivista | 2017 | Chevalier, Pascal; Schroeter, Michael; Bolognesi, Colombo R.; D'Alessandro, Vincenzo; Alexandrova, Maria; Boeck, Josef; Fluckinger, Ralf; Frégonèse, Sebastien; Heinemann, Bernd; Jungemann, Christoph; Lovblom, Rickard; Maneux, Cristell; Ostinelli, Olivier; Pawlak, Andreas; Rinaldi, Niccolo'; Rucker, Holger; Wedel, Gerald; Zimmer, Thomas | |
Delphi-like dynamical compact thermal models using model order reduction | 4.1 Articoli in Atti di convegno | 2017 | Rogié, Brice; Codecasa, Lorenzo; Monier-Vinard, Eric; Bissuel, Valentin; Laraqi, Najib; Daniel, Olivier; D'Amore, Dario; Magnani, Alessandro; D'Alessandro, Vincenzo; Rinaldi, Niccolo' | |
Simulation comparison of InGaP/GaAs HBT thermal performance in wire-bonding and flip-chip technologies | 1.1 Articolo in rivista | 2017 | D'Alessandro, Vincenzo; Catalano, ANTONIO PIO; Magnani, Alessandro; Codecasa, Lorenzo; Rinaldi, Niccolo'; Moser, Brian; Zampardi, Peter J. | |
Novel approach for the extraction of nonlinear compact thermal models | 4.1 Articoli in Atti di convegno | 2017 | Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo' | |
Fast nonlinear dynamic compact thermal modeling with multiple heat sources in Ultra-Thin Chip Stacking Technology | 1.1 Articolo in rivista | 2017 | Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo' | |
Connecting MOR-based boundary condition independent compact thermal models | 4.1 Articoli in Atti di convegno | 2017 | Codecasa, Lorenzo; Bornoff, Robin; Dyson, James; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo' | |
Numerical analysis of the thermal behavior sensitivity to technology parameters and operating conditions in InGaP/GaAs HBTs | 4.1 Articoli in Atti di convegno | 2017 | Catalano, ANTONIO PIO; Magnani, Alessandro; D'Alessandro, Vincenzo; Codecasa, Lorenzo; Rinaldi, Niccolo'; Moser, Brian; Zampardi, Peter J. | |
Partition-based approach to parametric dynamic compact thermal modeling | 1.1 Articolo in rivista | 2017 | Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo'; Metzger, Andre G.; Bornoff, Robin; Parry, John | |
Influence of layout and technology parameters on the thermal behavior of InGaP/GaAs HBTs | 4.1 Articoli in Atti di convegno | 2017 | Catalano, ANTONIO PIO; Magnani, Alessandro; D'Alessandro, Vincenzo; Codecasa, Lorenzo; Zampardi, Peter J.; Moser, Brian; Rinaldi, Niccolo' | |
Microscopic hot-carrier degradation modeling of SiGe HBTs under stress conditions close to the SOA limit | 1.1 Articolo in rivista | 2017 | Kamrani, Hamed; Jabs, Dominic; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Jacquet, Thomas; Maneux, Cristell; Zimmer, Thomas; Aufinger, Klaus; Jungemann, Christoph | |
A deterministic and self-consistent solver for the coupled carrier-phonon system in SiGe HBTs | 1.1 Articolo in rivista | 2017 | Kamrani, Hamed; Jabs, Dominic; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Aufinger, Klaus; Jungemann, Christoph | |
3-D thermal models calibration by parametric dynamic compact thermal models | 1.1 Articolo in rivista | 2017 | Codecasa, Lorenzo; D'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolo' | |
Physics-based hot-carrier degradation model for SiGe HBTs | 4.1 Articoli in Atti di convegno | 2016 | Hamed, Kamrani; Dominic, Jabs; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Christoph, Jungemann | |
Novel MOR approach for extracting dynamic compact thermal models with massive numbers of heat sources | 4.1 Articoli in Atti di convegno | 2016 | Lorenzo, Codecasa; Magnani, Alessandro; D'Alessandro, Vincenzo; Rinaldi, Niccolo'; Andre G., Metzger; John D., Parry; Robin B., Bornoff |
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