SPIRITO, PAOLO

SPIRITO, PAOLO  

Dipartimento di Ingegneria elettrica e delle Tecnologie dell'Informazione  

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Titolo Data di pubblicazione Autore(i) File
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention 1-gen-2009 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
A Dynamic Temperature Mapping System with a 320x256 Pixels Frame Size and 100kHz Sampling Rate 1-gen-2008 Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
A METHOD FOR IN-SITU CHARACTERIZATION OF SEMICONDUCTOR INTERFACE DURING A-SI SOLAR CELL FABRICATION 1-gen-2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; N., Martucciello; F., Roca
A new test structure for lifetime profiling in very thick lightly doped silicon material 1-gen-1998 Daliento, Santolo; A., Sanseverino; Spirito, Paolo
A novel test structure for the measurement of the multiplication coefficient in silicon 1-gen-1998 Daliento, Santolo; A., Sanseverino; Spirito, Paolo
A novel time-domain processor for real time SAR operation 1-gen-1998 Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing 1-gen-2010 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
A VLSI architecture for real time processing of one-bit coded SAR signals 1-gen-1998 Franceschetti, Giorgio; M., Tesauro; Strollo, ANTONIO GIUSEPPE MARIA; Napoli, Ettore; C., Cimino; Spirito, Paolo; Mazzeo, Antonino; Mazzocca, Nicola
Achieving accuracy in modeling the temperature coefficient of threshold voltage in MOS transistors with uniform and horizontally nonuniform channel doping 1-gen-2005 D'Alessandro, Vincenzo; Spirito, Paolo
All electrical resistivity profiling technique for ion implanted semiconductor materials 1-gen-2005 Daliento, Santolo; Mele, Luigi; Spirito, Paolo; Limata, BENEDICTA NORMANNA
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE TERMINAL TEST STRUCTURE 1-gen-2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE 1-gen-2003 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE SURFACE RECOMBINATION VELOCITY 1-gen-2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; G., Contento; N., Martucciello; I., Nasti; F., Roca
An equivalent time temperature mapping system with a 320x256 pixel full frame 100kHz sampling rate 1-gen-2007 Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
An experimental analysis of localized lifetime and resistivity control by helium implant in Si 1-gen-2005 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo
An experimental power-lines model for digital ASICs based on transmission-lines 1-gen-2012 Costagliola, Maurizio; DE CARO, Davide; A., Girardi; R., Izzi; Rinaldi, Niccolo'; M., Spirito; Spirito, Paolo
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography 1-gen-2010 Riccio, Michele; Rossi, Lucio; Irace, Andrea; Napoli, Ettore; Breglio, Giovanni; Spirito, Paolo; R., Tagami; Y., Mizuno
Analysis of local lifetime control and emitter efficiency control for the design of power PiN diodes 1-gen-1998 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
Analytical model for thermal instability of low voltage power MOS and S.O.A. in pulse operation 1-gen-2002 Spirito, Paolo; Breglio, Giovanni; D'Alessandro, Vincenzo; Rinaldi, Niccolo'
Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) 1-gen-2014 Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi