SPIRITO, PAOLO

SPIRITO, PAOLO  

DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE  

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Titolo Tipologia Data di pubblicazione Autore(i) File
Thermal Mapping of Power Devices with a Completely Automated Thermoreflectance Measurement System 4.1 Articoli in Atti di convegno 2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
A METHOD FOR IN-SITU CHARACTERIZATION OF SEMICONDUCTOR INTERFACE DURING A-SI SOLAR CELL FABRICATION 2.1 Contributo in volume (Capitolo o Saggio) 2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; N., Martucciello; F., Roca
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE 1.1 Articolo in rivista 2003 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
Lifetime and resistivity modifications induced by helium implantation in silicon: experimental analysis with the ac profiling technique 1.1 Articolo in rivista 2008 Daliento, Santolo; Mele, L; Spirito, Paolo; Gialanella, Lucio; Limata, BENEDICTA NORMANNA
Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the ac profiling technique 1.1 Articolo in rivista 2004 Spirito, Paolo; Daliento, Santolo; A., Sanseverino; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo
Development of an Electro-Optic step-by-step Sampling System for ICs Close Electro-Magnetic Field Measurement 4.1 Articoli in Atti di convegno 2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
PiN diode optimal design using local lifetime control 1.1 Articolo in rivista 1999 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
Numerical Analysis of Local Lifetime control for High-speed low-loss PiN diode design 1.1 Articolo in rivista 1999 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE SURFACE RECOMBINATION VELOCITY 2.1 Contributo in volume (Capitolo o Saggio) 2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; G., Contento; N., Martucciello; I., Nasti; F., Roca
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments 4.1 Articoli in Atti di convegno 2012 Irace, Andrea; Spirito, Paolo; Riccio, Michele; Breglio, Giovanni
Physics of the Negative Resistance in the Avalanche I-V Curve of Field Stop IGBTs: Collector Design Rules for Improved Ruggedness 1.1 Articolo in rivista 2014 Spirito, Paolo; Breglio, Giovanni; Irace, Andrea; Maresca, Luca; Napoli, Ettore; Riccio, Michele
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation 1.1 Articolo in rivista 2005 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; R., Letor; S., Russo
Design of IGBT with Integral Freewheeling Diode 1.1 Articolo in rivista 2002 Napoli, Ettore; Spirito, Paolo; Strollo, ANTONIO GIUSEPPE MARIA; F., Frisina; L., Fragapane; D., Fagone
Thermal simulation and ultrafast IR temperature mapping of a Smart Power Switch for automotive applications 4.1 Articoli in Atti di convegno 2009 Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; . Kosel V, .; Glavanovics, M.; Satka, A.
Two-Dimensional Modeling of On State Voltage Drop in IGBT 4.1 Articoli in Atti di convegno 1997 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching 1.1 Articolo in rivista 2004 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; E., D'Arcangelo
Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) 4.1 Articoli in Atti di convegno 2014 Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi
Experimental study on power consumption in lifetime engineered power diodes 1.1 Articolo in rivista 2009 Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: experiments and simulations 4.1 Articoli in Atti di convegno 2011 Riccio, Michele; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Napoli, Ettore; Y., Mizuno
Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect 4.1 Articoli in Atti di convegno 2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo