SPIRITO, PAOLO
SPIRITO, PAOLO
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect
2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
A METHOD FOR IN-SITU CHARACTERIZATION OF SEMICONDUCTOR INTERFACE DURING A-SI SOLAR CELL FABRICATION
2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; N., Martucciello; F., Roca
Design of a 600V Punch-through IGBT using local lifetime control. On-state voltage drop vs. turn-off time optimization.
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
Single Chip Implementation of 600V IGBT and Freewheeling Diode
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
Experimental study on power consumption in lifetime engineered power diodes
2009 Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin
The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results
1996 Breglio, Giovanni; R., Casavola; A., Cutolo; Spirito, Paolo
Experimental measurements of recombination lifetime in proton irradiated power devices
2000 Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss
Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy
2006 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo
An experimental analysis of localized lifetime and resistivity control by helium implant in Si
2005 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE
2003 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the ac profiling technique
2004 Spirito, Paolo; Daliento, Santolo; A., Sanseverino; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo
Semiconducto Device with Buffer Layer
2009 Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Merlin, L; Raffo, D; Bricconi, A.
Educational issues for power semiconductor devices (invited paper)
1996 Spirito, Paolo
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE TERMINAL TEST STRUCTURE
2002 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
Design criteria for PiN diode using multiple He ion implantation for local lifetime control
1999 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
Thermal transient mapping systems for integrated semiconductor devices and circuits
2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
A novel time-domain processor for real time SAR operation
1998 Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro
Fast Infrared thermal analysis of Smart Power MOSFETS in permanent short circuit operation
2006 Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; R., Letor; S., Russo
PiN diode optimal design using local lifetime control
1999 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
THERMOS3, a tool for 3D electrothermal simulation of smart power MOSFETs
2006 G., Buonaiuto; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
| Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|---|
| Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect | 4.1 Articoli in Atti di convegno | 2006 | Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
| A METHOD FOR IN-SITU CHARACTERIZATION OF SEMICONDUCTOR INTERFACE DURING A-SI SOLAR CELL FABRICATION | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; N., Martucciello; F., Roca | |
| Design of a 600V Punch-through IGBT using local lifetime control. On-state voltage drop vs. turn-off time optimization. | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
| Single Chip Implementation of 600V IGBT and Freewheeling Diode | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
| Experimental study on power consumption in lifetime engineered power diodes | 1.1 Articolo in rivista | 2009 | Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin | |
| The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results | 1.1 Articolo in rivista | 1996 | Breglio, Giovanni; R., Casavola; A., Cutolo; Spirito, Paolo | |
| Experimental measurements of recombination lifetime in proton irradiated power devices | 4.1 Articoli in Atti di convegno | 2000 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss | |
| Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy | 4.1 Articoli in Atti di convegno | 2006 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo | |
| An experimental analysis of localized lifetime and resistivity control by helium implant in Si | 4.1 Articoli in Atti di convegno | 2005 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo | |
| AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE | 1.1 Articolo in rivista | 2003 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca | |
| Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the ac profiling technique | 1.1 Articolo in rivista | 2004 | Spirito, Paolo; Daliento, Santolo; A., Sanseverino; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo | |
| Semiconducto Device with Buffer Layer | 6.1 Brevetto | 2009 | Irace, Andrea; Breglio, Giovanni; Spirito, Paolo; Merlin, L; Raffo, D; Bricconi, A. | |
| Educational issues for power semiconductor devices (invited paper) | 1.1 Articolo in rivista | 1996 | Spirito, Paolo | |
| AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE TERMINAL TEST STRUCTURE | 2.1 Contributo in volume (Capitolo o Saggio) | 2002 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca | |
| Design criteria for PiN diode using multiple He ion implantation for local lifetime control | 4.1 Articoli in Atti di convegno | 1999 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo | |
| Thermal transient mapping systems for integrated semiconductor devices and circuits | 4.1 Articoli in Atti di convegno | 2006 | Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
| A novel time-domain processor for real time SAR operation | 4.1 Articoli in Atti di convegno | 1998 | Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro | |
| Fast Infrared thermal analysis of Smart Power MOSFETS in permanent short circuit operation | 4.1 Articoli in Atti di convegno | 2006 | Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; R., Letor; S., Russo | |
| PiN diode optimal design using local lifetime control | 1.1 Articolo in rivista | 1999 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo | |
| THERMOS3, a tool for 3D electrothermal simulation of smart power MOSFETs | 4.1 Articoli in Atti di convegno | 2006 | G., Buonaiuto; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo |