SPIRITO, PAOLO
SPIRITO, PAOLO
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy
2006 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo
An experimental analysis of localized lifetime and resistivity control by helium implant in Si
2005 Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo
Experimental measurements of recombination lifetime in proton irradiated power devices
2000 Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE
2003 Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca
Single Chip Implementation of 600V IGBT and Freewheeling Diode
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
Design of a 600V Punch-through IGBT using local lifetime control. On-state voltage drop vs. turn-off time optimization.
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
Experimental study on power consumption in lifetime engineered power diodes
2009 Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin
He voids lifetime control compared with buffer-layer engineering for a 600V punch-through IGBT
2002 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone
THERMOS3, a tool for 3D electrothermal simulation of smart power MOSFETs
2006 G., Buonaiuto; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Fast Infrared thermal analysis of Smart Power MOSFETS in permanent short circuit operation
2006 Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; R., Letor; S., Russo
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments
2012 Irace, Andrea; Spirito, Paolo; Riccio, Michele; Breglio, Giovanni
Design criteria for PiN diode using multiple He ion implantation for local lifetime control
1999 Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo
Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect
2006 Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
Thermal instability in power BJT: a radiometric detection of transient temperature maps and electro-thermal simulation
1996 G., Pica; Scarpetta, Giovanni; Spirito, Paolo
Power semiconductor devices - continuous development
1996 N., Stojadinovic; Spirito, Paolo
The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results
1996 Breglio, Giovanni; R., Casavola; A., Cutolo; Spirito, Paolo
A novel test structure for the measurement of the multiplication coefficient in silicon
1998 Daliento, Santolo; A., Sanseverino; Spirito, Paolo
A novel time-domain processor for real time SAR operation
1998 Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro
Modeling and design of power PiN rectifier
1999 Spirito, Paolo
A new test structure for lifetime profiling in very thick lightly doped silicon material
1998 Daliento, Santolo; A., Sanseverino; Spirito, Paolo
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy | 4.1 Articoli in Atti di convegno | 2006 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; Limata, BENEDICTA NORMANNA; R., Carta; L., Bellemo | |
An experimental analysis of localized lifetime and resistivity control by helium implant in Si | 4.1 Articoli in Atti di convegno | 2005 | Daliento, Santolo; L., Mele; Spirito, Paolo; Gialanella, Lucio; Romano, Mario; B. N., Limata; R., Carta; L., Bellemo | |
Experimental measurements of recombination lifetime in proton irradiated power devices | 4.1 Articoli in Atti di convegno | 2000 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo; G., Busatto; J., Wyss | |
AN ELECTRICAL TECHNIQUE FOR THE MEASUREMENT OF THE INTERFACE RECOMBINATION VELOCITY BASED ON A THREE-TERMINAL TEST STRUCTURE | 1.1 Articolo in rivista | 2003 | Daliento, Santolo; Spirito, Paolo; Sanseverino, Annunziata; F., Roca | |
Single Chip Implementation of 600V IGBT and Freewheeling Diode | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
Design of a 600V Punch-through IGBT using local lifetime control. On-state voltage drop vs. turn-off time optimization. | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
Experimental study on power consumption in lifetime engineered power diodes | 1.1 Articolo in rivista | 2009 | Daliento, Santolo; L., Mele; Spirito, Paolo; R., Carta; L., Merlin | |
He voids lifetime control compared with buffer-layer engineering for a 600V punch-through IGBT | 4.1 Articoli in Atti di convegno | 2002 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; F., Frisina; L., Fragapane; D., Fagone | |
THERMOS3, a tool for 3D electrothermal simulation of smart power MOSFETs | 4.1 Articoli in Atti di convegno | 2006 | G., Buonaiuto; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
Fast Infrared thermal analysis of Smart Power MOSFETS in permanent short circuit operation | 4.1 Articoli in Atti di convegno | 2006 | Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; R., Letor; S., Russo | |
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments | 4.1 Articoli in Atti di convegno | 2012 | Irace, Andrea; Spirito, Paolo; Riccio, Michele; Breglio, Giovanni | |
Design criteria for PiN diode using multiple He ion implantation for local lifetime control | 4.1 Articoli in Atti di convegno | 1999 | Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo | |
Characterization of a Point-Wise Close Electric Field Sampling System exploiting the Electro-Optic Effect | 4.1 Articoli in Atti di convegno | 2006 | Rossi, Lucio; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
Thermal instability in power BJT: a radiometric detection of transient temperature maps and electro-thermal simulation | 1.1 Articolo in rivista | 1996 | G., Pica; Scarpetta, Giovanni; Spirito, Paolo | |
Power semiconductor devices - continuous development | 1.1 Articolo in rivista | 1996 | N., Stojadinovic; Spirito, Paolo | |
The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results | 1.1 Articolo in rivista | 1996 | Breglio, Giovanni; R., Casavola; A., Cutolo; Spirito, Paolo | |
A novel test structure for the measurement of the multiplication coefficient in silicon | 4.1 Articoli in Atti di convegno | 1998 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo | |
A novel time-domain processor for real time SAR operation | 4.1 Articoli in Atti di convegno | 1998 | Franceschetti, Giorgio; Mazzeo, Antonino; Mazzocca, Nicola; Napoli, Ettore; Strollo, ANTONIO GIUSEPPE MARIA; Spirito, Paolo; M., Tesauro | |
Modeling and design of power PiN rectifier | 8.10 Tesi di Dottorato | 1999 | Spirito, Paolo | |
A new test structure for lifetime profiling in very thick lightly doped silicon material | 4.1 Articoli in Atti di convegno | 1998 | Daliento, Santolo; A., Sanseverino; Spirito, Paolo |