CdTe crystals grown by the Traveling Heater Method (THM) often show a pronounced non-uniformity along the ingots due to the thermal irregularities, the Te-excess growth conditions resulting from the retrograde slope of the solidus line of the phase diagram, and to the introduced impurities. In addition, structural defects can be present that affect the electrical and optical properties of the crystals. © 2011 IEEE.

Characterization of X- and gamma- ray CdTe radiation detectors / A., Raulo; M. S. O. W. I. N. S. K., A.; G., Hennard; Campajola, Luigi; D., Marano; Paternoster, Giovanni; Perillo, Eugenio. - IEEE NSS 2012 Conference Record:(2012), pp. 4795-4798. [10.1109/NSSMIC.2011.6154716]

Characterization of X- and gamma- ray CdTe radiation detectors

CAMPAJOLA, LUIGI;PATERNOSTER, GIOVANNI;PERILLO, EUGENIO
2012

Abstract

CdTe crystals grown by the Traveling Heater Method (THM) often show a pronounced non-uniformity along the ingots due to the thermal irregularities, the Te-excess growth conditions resulting from the retrograde slope of the solidus line of the phase diagram, and to the introduced impurities. In addition, structural defects can be present that affect the electrical and optical properties of the crystals. © 2011 IEEE.
2012
Characterization of X- and gamma- ray CdTe radiation detectors / A., Raulo; M. S. O. W. I. N. S. K., A.; G., Hennard; Campajola, Luigi; D., Marano; Paternoster, Giovanni; Perillo, Eugenio. - IEEE NSS 2012 Conference Record:(2012), pp. 4795-4798. [10.1109/NSSMIC.2011.6154716]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/465326
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