PERILLO, EUGENIO
PERILLO, EUGENIO
DIPARTIMENTO DI SCIENZE FISICHE (attivo dal 01/01/1988 al 31/12/2012)
PIXE cross sections for some moderately toxic heavy metals
1998 DE CESARE, Nicola; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano
Proton- and He-4-ion-induced L-shell ionization of Pt, Pb and Bi
1999 Balsamo, A; DE CESARE, Nicola; Murolo, F; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano
Surface structure investigations on CdTe crystals by ion beams
1988 A. M., Mancini; A., Quirini; L., Vasanelli; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; R., Giorgi
HgI2 X- and gamma-ray camera with spectrometric capabilities
1996 Dusi, W; Caroli, E; Donati, A; Olivieri, C; Ramunno, G; Grassi, D; Perillo, Eugenio; Spadaccini, Giulio; Amann, M; Koebel, Jm; Siffert, P.
A resistive charge division based microstrip detector for X-ray and gamma-ray spectrometers
1994 Grassi, D; Murolo, F; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; Amann, M; Koebel, Jm; Siffert, P; Dusi, W.
HgI2 two-dimensional arrays based on resistive charge division readout
1998 S., Alfieri; DE CESARE, Nicola; D., Grassi; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; W., Dusi; M., Amann; J. M., Koebel; P., Siffert
A resistive charge division based microstrip detector for X- and -ray spectrometers
1993 D., Grassi; F., Murolo; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; M., Amann; J. M., Koebel; P., Siffert; W., Dusi
Absolute L-subshell ionization cross sections for proton bombardment of Cd, Sb and Te
1984 P., Cuzzocrea; Perillo, Eugenio; Rosato, Elio; Spadaccini, Giulio; Vigilante, Mariano
A new radiation detector made of multi-walled carbon nanotubes
2008 Ambrosio, Antonio; M., Ambrosio; Ambrosone, Giuseppina; V., Carillo; Coscia, Ubaldo; V., Grossi; Maddalena, Pasqualino; M., Passacantando; Perillo, Eugenio; Raulo, Adelaide; S., Santucci
Photoconductivity in defective carbon nanotube sheets under ultraviolet-visible-near infrared radiation
2008 M., Passacantando; F., Bussolotti; V., Grossi; S., Santucci; Ambrosio, Antonio; M., Ambrosio; Ambrosone, Giuseppina; V., Carillo; Coscia, Ubaldo; Maddalena, Pasqualino; Perillo, Eugenio; Raulo, Adelaide
Characterization of X- and gamma- ray CdTe radiation detectors
2012 A., Raulo; M. S. O. W. I. N. S. K., A.; G., Hennard; Campajola, Luigi; D., Marano; Paternoster, Giovanni; Perillo, Eugenio
Simulation of the collection properties of CDTe strip detectors
2001 A., Cola; F., Quaranta; E., Caroli; W., Dusi; Perillo, Eugenio
Spectroscopic response of a CdTe microstrip detector when irradiated at various impinging angles
2004 Perillo, Eugenio; Cola, A.; Donati, A.; Dusi, W.; Landini, G.; Raulo, A.; Ventura, G.; Vitulli, S.
A comparison between the response of compound semiconductor detectors in single and back-to-back configuration
2004 Auricchio, N.; Donati, A.; Dusi, W.; Perillo, Eugenio; Siffert, P.
Electric field distribution and charge transport properties in diode-like CdTe X-ray detectors
2006 Cola, A; Farella, I; Mancini, A. M.; Dusi, W; Perillo, Eugenio
Charge transients Locally Induced by Laser Pulses in CdTe Planar and Multi-Strip Detectors
2005 Farella, I; Cola, A; Caroli, E; Donati, A; Dusi, W; Ventura, G; Perillo, Eugenio
Study of the thickness of the dead layer below electrodes, deposited by electroless technique, in CdTe nuclear detectors
2006 Zahraman, K; Roumie, M; Raulo, A; Auricchio, N; Ayoub, M; Donati, A; Dusi, W; HAGE ALI, M; Lmai, F; Perillo, Eugenio; Siffert, P; Sowinska, M; Ventura, G; Febbraio,
An experimental method to evaluate the dead layer thickness of X- and Gamma-ray semiconductor detectors
2004 Dusi, W.; Donati, A.; Landini, G.; Perillo, Eugenio; Raulo, A.; Ventura, G.; Vitulli, S.
Investigation on the performances of multiple microstrip CdTe detectors
2007 Raulo, A; Auricchio, N; Cola, A; Dambrosio, L; Donati, A; Dusi, W; Gostilo, V; Landini, G; Perillo, Eugenio; Siffert, P; Sowinska, M; Ventura, G.
L3-subshell x-ray emission rates for Dy and Ho
2007 Raulo, A; Grassi, D; Perillo, Eugenio
Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
---|---|---|---|---|
PIXE cross sections for some moderately toxic heavy metals | 1.1 Articolo in rivista | 1998 | DE CESARE, Nicola; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano | |
Proton- and He-4-ion-induced L-shell ionization of Pt, Pb and Bi | 1.1 Articolo in rivista | 1999 | Balsamo, A; DE CESARE, Nicola; Murolo, F; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano | |
Surface structure investigations on CdTe crystals by ion beams | 1.1 Articolo in rivista | 1988 | A. M., Mancini; A., Quirini; L., Vasanelli; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; R., Giorgi | |
HgI2 X- and gamma-ray camera with spectrometric capabilities | 1.1 Articolo in rivista | 1996 | Dusi, W; Caroli, E; Donati, A; Olivieri, C; Ramunno, G; Grassi, D; Perillo, Eugenio; Spadaccini, Giulio; Amann, M; Koebel, Jm; Siffert, P. | |
A resistive charge division based microstrip detector for X-ray and gamma-ray spectrometers | 1.1 Articolo in rivista | 1994 | Grassi, D; Murolo, F; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; Amann, M; Koebel, Jm; Siffert, P; Dusi, W. | |
HgI2 two-dimensional arrays based on resistive charge division readout | 4.1 Articoli in Atti di convegno | 1998 | S., Alfieri; DE CESARE, Nicola; D., Grassi; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; W., Dusi; M., Amann; J. M., Koebel; P., Siffert | |
A resistive charge division based microstrip detector for X- and -ray spectrometers | 4.1 Articoli in Atti di convegno | 1993 | D., Grassi; F., Murolo; Perillo, Eugenio; Spadaccini, Giulio; Vigilante, Mariano; M., Amann; J. M., Koebel; P., Siffert; W., Dusi | |
Absolute L-subshell ionization cross sections for proton bombardment of Cd, Sb and Te | 4.1 Articoli in Atti di convegno | 1984 | P., Cuzzocrea; Perillo, Eugenio; Rosato, Elio; Spadaccini, Giulio; Vigilante, Mariano | |
A new radiation detector made of multi-walled carbon nanotubes | 1.1 Articolo in rivista | 2008 | Ambrosio, Antonio; M., Ambrosio; Ambrosone, Giuseppina; V., Carillo; Coscia, Ubaldo; V., Grossi; Maddalena, Pasqualino; M., Passacantando; Perillo, Eugenio; Raulo, Adelaide; S., Santucci | |
Photoconductivity in defective carbon nanotube sheets under ultraviolet-visible-near infrared radiation | 1.1 Articolo in rivista | 2008 | M., Passacantando; F., Bussolotti; V., Grossi; S., Santucci; Ambrosio, Antonio; M., Ambrosio; Ambrosone, Giuseppina; V., Carillo; Coscia, Ubaldo; Maddalena, Pasqualino; Perillo, Eugenio; Raulo, Adelaide | |
Characterization of X- and gamma- ray CdTe radiation detectors | 2.1 Contributo in volume (Capitolo o Saggio) | 2012 | A., Raulo; M. S. O. W. I. N. S. K., A.; G., Hennard; Campajola, Luigi; D., Marano; Paternoster, Giovanni; Perillo, Eugenio | |
Simulation of the collection properties of CDTe strip detectors | 1.1 Articolo in rivista | 2001 | A., Cola; F., Quaranta; E., Caroli; W., Dusi; Perillo, Eugenio | |
Spectroscopic response of a CdTe microstrip detector when irradiated at various impinging angles | 1.1 Articolo in rivista | 2004 | Perillo, Eugenio; Cola, A.; Donati, A.; Dusi, W.; Landini, G.; Raulo, A.; Ventura, G.; Vitulli, S. | |
A comparison between the response of compound semiconductor detectors in single and back-to-back configuration | 1.1 Articolo in rivista | 2004 | Auricchio, N.; Donati, A.; Dusi, W.; Perillo, Eugenio; Siffert, P. | |
Electric field distribution and charge transport properties in diode-like CdTe X-ray detectors | 1.1 Articolo in rivista | 2006 | Cola, A; Farella, I; Mancini, A. M.; Dusi, W; Perillo, Eugenio | |
Charge transients Locally Induced by Laser Pulses in CdTe Planar and Multi-Strip Detectors | 1.1 Articolo in rivista | 2005 | Farella, I; Cola, A; Caroli, E; Donati, A; Dusi, W; Ventura, G; Perillo, Eugenio | |
Study of the thickness of the dead layer below electrodes, deposited by electroless technique, in CdTe nuclear detectors | 1.1 Articolo in rivista | 2006 | Zahraman, K; Roumie, M; Raulo, A; Auricchio, N; Ayoub, M; Donati, A; Dusi, W; HAGE ALI, M; Lmai, F; Perillo, Eugenio; Siffert, P; Sowinska, M; Ventura, G; Febbraio, | |
An experimental method to evaluate the dead layer thickness of X- and Gamma-ray semiconductor detectors | 1.1 Articolo in rivista | 2004 | Dusi, W.; Donati, A.; Landini, G.; Perillo, Eugenio; Raulo, A.; Ventura, G.; Vitulli, S. | |
Investigation on the performances of multiple microstrip CdTe detectors | 1.1 Articolo in rivista | 2007 | Raulo, A; Auricchio, N; Cola, A; Dambrosio, L; Donati, A; Dusi, W; Gostilo, V; Landini, G; Perillo, Eugenio; Siffert, P; Sowinska, M; Ventura, G. | |
L3-subshell x-ray emission rates for Dy and Ho | 1.1 Articolo in rivista | 2007 | Raulo, A; Grassi, D; Perillo, Eugenio |