RICCIO, MICHELE
RICCIO, MICHELE
DIPARTIMENTO DI INGEGNERIA ELETTRICA E TECNOLOGIE DELL'INFORMAZIONE
Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
2014 Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi
50W X-band GaN MMIC HPA: Effective Power Capability and Transient Thermal Analysis
2010 C., Costrini; A., Cetronio; P., Romanini; Breglio, Giovanni; Irace, Andrea; Riccio, Michele
A Dynamic Temperature Mapping System with a 320x256 Pixels Frame Size and 100kHz Sampling Rate
2008 Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo
Assessing the spatial correlation and conduction state of breakdown spot patterns in Pt/HfO2/Pt structures using transient infrared thermography
2014 E., Miranda; Riccio, Michele; DE FALCO, Giuseppe; J., Blasco; J., Sune; Irace, Andrea
Electro-thermal analysis of MEMS microhotplates for the optimization of temperature uniformity
2011 L., Mele; T., Rossi; Riccio, Michele; E., Iervolino; F., Santagata; Irace, Andrea; Breglio, Giovanni; J. F., Creemer; P. M., Sarro
Thermal-aware design and fault analysis of a DC/DC parallel resonant converter
2014 DE FALCO, Giuseppe; Riccio, Michele; Breglio, Giovanni; Irace, Andrea
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography
2010 Riccio, Michele; Rossi, Lucio; Irace, Andrea; Napoli, Ettore; Breglio, Giovanni; Spirito, Paolo; R., Tagami; Y., Mizuno
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography
2008 Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta
Temperature dependence of the resonance frequency of thermogravimetric devices
2010 E., Iervolino; Riccio, Michele; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; W., van der Vlist; P. M., Sarroc
Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology
2011 Riccio, Michele; A., Pantellini; Irace, Andrea; Breglio, Giovanni; A., Nanni; C., Lanzieri
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing
2010 Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo
Resonance frequency of locally heated cantilever beams
2013 E., Iervolino; Riccio, Michele; F., Santagata; J., Wei; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; P. M., Sarro
Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching
2012 J., Rhayem; A., Wieers; A., Vrbicky; P., Moens; A., Villamor Baliarda; J., Roig; P., Vanmeerbeek; Irace, Andrea; Riccio, Michele; M., Tack
Physics of the Negative Resistance in the Avalanche I-V Curve of Field Stop IGBTs: Collector Design Rules for Improved Ruggedness
2014 Spirito, Paolo; Breglio, Giovanni; Irace, Andrea; Maresca, Luca; Napoli, Ettore; Riccio, Michele
ELDO-COMSOL based 3D electro-thermal simulations of power semiconductor devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)
2014 DE FALCO, Giuseppe; Riccio, Michele; Romano, Gianpaolo; Maresca, Luca; Irace, Andrea; Breglio, Giovanni
Short-circuit robustness of SiC Power MOSFETs: Experimental analysis2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
2014 Alberto, Castellazzi; Asad, Fayyaz; Li, Yang; Riccio, Michele; Irace, Andrea
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments
2012 Irace, Andrea; Spirito, Paolo; Riccio, Michele; Breglio, Giovanni
Lock-in thermography for the localization of prebreakdown leakage current on power diodes
2009 Irace, Andrea; Breglio, Giovanni; Riccio, Michele
Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell
2011 Maresca, L.; DE LAURENTIS, Martina; Riccio, Michele; Irace, Andrea; Breglio, Giovanni
Transmission line pulse system for avalanche characterization of high power semiconductor devicesVLSI Circuits and Systems VI
2013 Riccio, Michele; Giovanni, Ascione; DE FALCO, Giuseppe; Maresca, Luca; DE LAURENTIS, Martina; Irace, Andrea; Breglio, Giovanni
| Titolo | Tipologia | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|---|
| Cell pitch influence on the current distribution during avalanche operation of trench IGBTs: Design issues to increase UIS ruggedness2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) | 4.1 Articoli in Atti di convegno | 2014 | Riccio, Michele; Maresca, Luca; DE FALCO, Giuseppe; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo; Y., Iwahashi | |
| 50W X-band GaN MMIC HPA: Effective Power Capability and Transient Thermal Analysis | 4.1 Articoli in Atti di convegno | 2010 | C., Costrini; A., Cetronio; P., Romanini; Breglio, Giovanni; Irace, Andrea; Riccio, Michele | |
| A Dynamic Temperature Mapping System with a 320x256 Pixels Frame Size and 100kHz Sampling Rate | 4.1 Articoli in Atti di convegno | 2008 | Riccio, Michele; Breglio, Giovanni; Irace, Andrea; Spirito, Paolo | |
| Assessing the spatial correlation and conduction state of breakdown spot patterns in Pt/HfO2/Pt structures using transient infrared thermography | 1.1 Articolo in rivista | 2014 | E., Miranda; Riccio, Michele; DE FALCO, Giuseppe; J., Blasco; J., Sune; Irace, Andrea | |
| Electro-thermal analysis of MEMS microhotplates for the optimization of temperature uniformity | 1.1 Articolo in rivista | 2011 | L., Mele; T., Rossi; Riccio, Michele; E., Iervolino; F., Santagata; Irace, Andrea; Breglio, Giovanni; J. F., Creemer; P. M., Sarro | |
| Thermal-aware design and fault analysis of a DC/DC parallel resonant converter | 1.1 Articolo in rivista | 2014 | DE FALCO, Giuseppe; Riccio, Michele; Breglio, Giovanni; Irace, Andrea | |
| Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography | 1.1 Articolo in rivista | 2010 | Riccio, Michele; Rossi, Lucio; Irace, Andrea; Napoli, Ettore; Breglio, Giovanni; Spirito, Paolo; R., Tagami; Y., Mizuno | |
| Detection of localized UIS failure on IGBTs with the aid of lock-in thermography | 1.1 Articolo in rivista | 2008 | Breglio, Giovanni; Irace, Andrea; Napoli, Ettore; Riccio, Michele; Spirito, Paolo; K., Hamada; T., Nishijima; T., Ueta | |
| Temperature dependence of the resonance frequency of thermogravimetric devices | 1.1 Articolo in rivista | 2010 | E., Iervolino; Riccio, Michele; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; W., van der Vlist; P. M., Sarroc | |
| Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology | 1.1 Articolo in rivista | 2011 | Riccio, Michele; A., Pantellini; Irace, Andrea; Breglio, Giovanni; A., Nanni; C., Lanzieri | |
| A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing | 1.1 Articolo in rivista | 2010 | Rossi, Lucio; Riccio, Michele; Napoli, Ettore; Irace, Andrea; Breglio, Giovanni; Spirito, Paolo | |
| Resonance frequency of locally heated cantilever beams | 1.1 Articolo in rivista | 2013 | E., Iervolino; Riccio, Michele; F., Santagata; J., Wei; A. W., van Herwaarden; Irace, Andrea; Breglio, Giovanni; P. M., Sarro | |
| Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching | 4.1 Articoli in Atti di convegno | 2012 | J., Rhayem; A., Wieers; A., Vrbicky; P., Moens; A., Villamor Baliarda; J., Roig; P., Vanmeerbeek; Irace, Andrea; Riccio, Michele; M., Tack | |
| Physics of the Negative Resistance in the Avalanche I-V Curve of Field Stop IGBTs: Collector Design Rules for Improved Ruggedness | 1.1 Articolo in rivista | 2014 | Spirito, Paolo; Breglio, Giovanni; Irace, Andrea; Maresca, Luca; Napoli, Ettore; Riccio, Michele | |
| ELDO-COMSOL based 3D electro-thermal simulations of power semiconductor devices2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) | 4.1 Articoli in Atti di convegno | 2014 | DE FALCO, Giuseppe; Riccio, Michele; Romano, Gianpaolo; Maresca, Luca; Irace, Andrea; Breglio, Giovanni | |
| Short-circuit robustness of SiC Power MOSFETs: Experimental analysis2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) | 4.1 Articoli in Atti di convegno | 2014 | Alberto, Castellazzi; Asad, Fayyaz; Li, Yang; Riccio, Michele; Irace, Andrea | |
| Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments | 4.1 Articoli in Atti di convegno | 2012 | Irace, Andrea; Spirito, Paolo; Riccio, Michele; Breglio, Giovanni | |
| Lock-in thermography for the localization of prebreakdown leakage current on power diodes | 4.1 Articoli in Atti di convegno | 2009 | Irace, Andrea; Breglio, Giovanni; Riccio, Michele | |
| Floating field ring technique applied to enhance fill factor of silicon photomultiplier elementary cell | 4.1 Articoli in Atti di convegno | 2011 | Maresca, L.; DE LAURENTIS, Martina; Riccio, Michele; Irace, Andrea; Breglio, Giovanni | |
| Transmission line pulse system for avalanche characterization of high power semiconductor devicesVLSI Circuits and Systems VI | 4.1 Articoli in Atti di convegno | 2013 | Riccio, Michele; Giovanni, Ascione; DE FALCO, Giuseppe; Maresca, Luca; DE LAURENTIS, Martina; Irace, Andrea; Breglio, Giovanni |