Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching / J., R., A., W., A., V., P., M., A., V.B., J., R., P., V., Irace, A., Riccio, M., M., T.. - STAMPA. - (2012), pp. 69-73. (2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) San Jose 18-22 March 2012) [10.1109/STHERM.2012.6188828].

Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching

IRACE, ANDREA;RICCIO, MICHELE;
2012

2012
9781467311090
9781467311106
9781467311113
Novel 3D electro-thermal robustness optimization approach of super junction power MOSFETs under unclamped inductive switching / J., R., A., W., A., V., P., M., A., V.B., J., R., P., V., Irace, A., Riccio, M., M., T.. - STAMPA. - (2012), pp. 69-73. (2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) San Jose 18-22 March 2012) [10.1109/STHERM.2012.6188828].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/460546
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