Analysis of the thermal behavior of trench-isolated bipolar transistors fabricated on SOI substrates / Ilaria, M., D'Alessandro, V., Rinaldi, N.. - (2008), pp. 397-403. (IEEE 9th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE) Freiburg, Germany Apr. 2008) [10.1109/ESIME.2008.4525063].

Analysis of the thermal behavior of trench-isolated bipolar transistors fabricated on SOI substrates

d'ALESSANDRO, VINCENZO;RINALDI, NICCOLO'
2008

2008
9781424421275
Analysis of the thermal behavior of trench-isolated bipolar transistors fabricated on SOI substrates / Ilaria, M., D'Alessandro, V., Rinaldi, N.. - (2008), pp. 397-403. (IEEE 9th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems (EuroSimE) Freiburg, Germany Apr. 2008) [10.1109/ESIME.2008.4525063].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/305866
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