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Methods for extracting the temperature and power dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies / Müller, Markus; D’Alessandro, Vincenzo; Falk, Sophia; Weimer, Christoph; Jin, Xiaodi; Krattenmacher, Mario; Kuthe, Pascal; Claus, Martin; Schröter, Michael. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 69:8(2022), pp. 4064-4074. [10.1109/TED.2022.3185574]

Methods for extracting the temperature and power dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies

Vincenzo d’Alessandro;
2022
2022
Methods for extracting the temperature and power dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies / Müller, Markus; D’Alessandro, Vincenzo; Falk, Sophia; Weimer, Christoph; Jin, Xiaodi; Krattenmacher, Mario; Kuthe, Pascal; Claus, Martin; Schröter, Michael. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 69:8(2022), pp. 4064-4074. [10.1109/TED.2022.3185574]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/946454
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