Methods for extracting the temperature and power dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies / Müller, M., D’Alessandro, V., Falk, S., Weimer, C., Jin, X., Krattenmacher, M., Kuthe, P., Claus, M., Schröter, M.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 69:8(2022), pp. 4064-4074. [10.1109/TED.2022.3185574]

Methods for extracting the temperature and power dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies

Vincenzo d’Alessandro;
2022

2022
Methods for extracting the temperature and power dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies / Müller, M., D’Alessandro, V., Falk, S., Weimer, C., Jin, X., Krattenmacher, M., Kuthe, P., Claus, M., Schröter, M.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 69:8(2022), pp. 4064-4074. [10.1109/TED.2022.3185574]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/946454
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