Special Issue on Design, Technology, and Test of Integrated Circuits and Systems / Bosio, A.; Barbareschi, M.. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 28:supp01(2019), p. 1902001. [10.1142/S0218126619020018]

Special Issue on Design, Technology, and Test of Integrated Circuits and Systems

Barbareschi M.
2019

2019
Special Issue on Design, Technology, and Test of Integrated Circuits and Systems / Bosio, A.; Barbareschi, M.. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 28:supp01(2019), p. 1902001. [10.1142/S0218126619020018]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/915821
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