This paper describes the scintillation features and the radiation damage in polyethylene naphthalate 100 µm-thick scintillators irradiated with an 11 MeV proton beam and with a 1 MeV electron beam at doses up to 15 and 85 Mrad, respectively. The scintillator emission spectrum, optical transmission, light yield loss, and scintillation pulse decay times were investigated before and after the irradiation. A deep blue emission spectrum peaked at 422 nm, and fast and slow scintillation decay time constants of the order of 1-2 ns and 25-30 nm, respectively, were measured. After irradiation, transmittance showed a loss of transparency for wavelengths between 380 and 420 nm, and a light yield reduction of ~40% was measured at the maximum dose of 85 Mrad.

Radiation Damage in Polyethylene Naphthalate Thin-Film Scintillators / Campajola, Marcello; Di Capua, Francesco; Casolaro, Pierluigi; Sarnelli, Ettore; Aloisio, Alberto. - In: MATERIALS. - ISSN 1996-1944. - 15:19(2022), p. 6530. [10.3390/ma15196530]

Radiation Damage in Polyethylene Naphthalate Thin-Film Scintillators

Campajola, Marcello;Di Capua, Francesco;Casolaro, Pierluigi;Aloisio, Alberto
2022

Abstract

This paper describes the scintillation features and the radiation damage in polyethylene naphthalate 100 µm-thick scintillators irradiated with an 11 MeV proton beam and with a 1 MeV electron beam at doses up to 15 and 85 Mrad, respectively. The scintillator emission spectrum, optical transmission, light yield loss, and scintillation pulse decay times were investigated before and after the irradiation. A deep blue emission spectrum peaked at 422 nm, and fast and slow scintillation decay time constants of the order of 1-2 ns and 25-30 nm, respectively, were measured. After irradiation, transmittance showed a loss of transparency for wavelengths between 380 and 420 nm, and a light yield reduction of ~40% was measured at the maximum dose of 85 Mrad.
2022
Radiation Damage in Polyethylene Naphthalate Thin-Film Scintillators / Campajola, Marcello; Di Capua, Francesco; Casolaro, Pierluigi; Sarnelli, Ettore; Aloisio, Alberto. - In: MATERIALS. - ISSN 1996-1944. - 15:19(2022), p. 6530. [10.3390/ma15196530]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/899337
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