Hydrogenated amorphous silicon (a-Si:H) has been already considered for the objective of passive optical elements, like waveguides and ring resonators, within photonic integrated circuits at λ = 1.55 μm. However the study of its electro-optical properties is still at an early stage, therefore this semiconductor in practice is not considered for light modulation as yet. We demonstrated, for the first time, effective electrooptical modulation in a reverse biased a-Si:H p-i-n waveguiding structure. In particular, phase modulation was studied in a waveguide integrated Fabry-Perot resonator in which the Vπ·Lπ product was determined to be 63 V·cm. Characteristic switch-on and switch-off times of 14 ns were measured. The device employed a wider gap amorphous silicon carbide (a-SiC:H) film for the lower cladding layer instead of silicon oxide. In this way the highest temperature involved in the fabrication process was 170°C, which ensured the desired technological compatibility with CMOS processes. © 2011 Optical Society of America.

Electro-optical modulation at 1550 nm in an asdeposited hydrogenated amorphous silicon p-i-n waveguiding device / Della Corte, F.G., Rao, S., Coppola, G., Summonte, C.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 19:4(2011), pp. 2941-2951. [10.1364/OE.19.002941]

Electro-optical modulation at 1550 nm in an asdeposited hydrogenated amorphous silicon p-i-n waveguiding device

Della Corte F. G.;
2011

Abstract

Hydrogenated amorphous silicon (a-Si:H) has been already considered for the objective of passive optical elements, like waveguides and ring resonators, within photonic integrated circuits at λ = 1.55 μm. However the study of its electro-optical properties is still at an early stage, therefore this semiconductor in practice is not considered for light modulation as yet. We demonstrated, for the first time, effective electrooptical modulation in a reverse biased a-Si:H p-i-n waveguiding structure. In particular, phase modulation was studied in a waveguide integrated Fabry-Perot resonator in which the Vπ·Lπ product was determined to be 63 V·cm. Characteristic switch-on and switch-off times of 14 ns were measured. The device employed a wider gap amorphous silicon carbide (a-SiC:H) film for the lower cladding layer instead of silicon oxide. In this way the highest temperature involved in the fabrication process was 170°C, which ensured the desired technological compatibility with CMOS processes. © 2011 Optical Society of America.
2011
Electro-optical modulation at 1550 nm in an asdeposited hydrogenated amorphous silicon p-i-n waveguiding device / Della Corte, F.G., Rao, S., Coppola, G., Summonte, C.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 19:4(2011), pp. 2941-2951. [10.1364/OE.19.002941]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/849647
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