A Measurement-Domain Specific Language (MDSL) for test procedure definition, measurement tasks synchronization, and instrument configuration is proposed. MDSL is a formal language specially designed for a specific domain of measurement and test, aimed at specifying complete, easy-to-understand, -reuse, and -maintain applications efficiently and quickly. Owing to MDSL constructs capability of abstracting key concepts of the domain, the test engineer can write more concise and higher level programs in shorter time without being a skilled programmer. The MDSL has been applied to the specifications of superconducting magnet tests of the Large Hadron Collider at CERN. © 2009 IEEE.

Measurement-Domain Specific Language for magnetic test specifications at CERN / Arpaia, P.; Buzio, M.; Fiscarelli, L.; Inglese, V.; La Commara, G.; Walckiers, L.. - (2009), pp. 1716-1720. (Intervento presentato al convegno 2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009 tenutosi a Singapore, sgp nel 2009) [10.1109/IMTC.2009.5168733].

Measurement-Domain Specific Language for magnetic test specifications at CERN

Arpaia P.;
2009

Abstract

A Measurement-Domain Specific Language (MDSL) for test procedure definition, measurement tasks synchronization, and instrument configuration is proposed. MDSL is a formal language specially designed for a specific domain of measurement and test, aimed at specifying complete, easy-to-understand, -reuse, and -maintain applications efficiently and quickly. Owing to MDSL constructs capability of abstracting key concepts of the domain, the test engineer can write more concise and higher level programs in shorter time without being a skilled programmer. The MDSL has been applied to the specifications of superconducting magnet tests of the Large Hadron Collider at CERN. © 2009 IEEE.
2009
978-1-4244-3352-0
Measurement-Domain Specific Language for magnetic test specifications at CERN / Arpaia, P.; Buzio, M.; Fiscarelli, L.; Inglese, V.; La Commara, G.; Walckiers, L.. - (2009), pp. 1716-1720. (Intervento presentato al convegno 2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009 tenutosi a Singapore, sgp nel 2009) [10.1109/IMTC.2009.5168733].
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/846146
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 10
  • ???jsp.display-item.citation.isi??? ND
social impact