Whenever one is interested in making high temperature superconductor-based devices, the goodness of the sample surface in terms of structural and electrical properties is a strong issue. In fact, it is well known that the surface of high Tc superconducting samples is not bulk-representative, due to air contamination and to the possible presence of oxygen vacancies. In addition, the quality of the surface layer results to be crucial in surface sensitive measurements as in X-ray photoelectron and Angle-resolved photoemission spectroscopy. Recently, some studies have been dedicated to the realization of devices based on electron-doped cuprates, bilayers and nanowires, showing the actual possibility to realize good quality junctions by using these cuprates. In this work, we report on the fabrication of thin films of the electron-doped Nd2−xCexCuO4±δ compound and analyze the surface natural barrier of as-grown films by means of point contact spectroscopy measurements. Suitable treatments of samples in an ozone rich atmosphere have been developed in order to improve the surface quality of the films. Auger electron spectroscopy has been used to monitor the effectiveness of these treatments.
Study of the surface properties of NCCO electron-doped cuprate / Guarino, A.; Romano, P.; Fujii, J.; Ruosi, A.; Avitabile, F.; Vobornik, I.; Panaccione, G.; Vecchione, A.; Nigro, A.. - In: THE EUROPEAN PHYSICAL JOURNAL. SPECIAL TOPICS. - ISSN 1951-6355. - 228:3(2019), pp. 733-739. [10.1140/epjst/e2019-800208-9]
Study of the surface properties of NCCO electron-doped cuprate
Ruosi A.;
2019
Abstract
Whenever one is interested in making high temperature superconductor-based devices, the goodness of the sample surface in terms of structural and electrical properties is a strong issue. In fact, it is well known that the surface of high Tc superconducting samples is not bulk-representative, due to air contamination and to the possible presence of oxygen vacancies. In addition, the quality of the surface layer results to be crucial in surface sensitive measurements as in X-ray photoelectron and Angle-resolved photoemission spectroscopy. Recently, some studies have been dedicated to the realization of devices based on electron-doped cuprates, bilayers and nanowires, showing the actual possibility to realize good quality junctions by using these cuprates. In this work, we report on the fabrication of thin films of the electron-doped Nd2−xCexCuO4±δ compound and analyze the surface natural barrier of as-grown films by means of point contact spectroscopy measurements. Suitable treatments of samples in an ozone rich atmosphere have been developed in order to improve the surface quality of the films. Auger electron spectroscopy has been used to monitor the effectiveness of these treatments.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
