Search for dark matter with a 231-day exposure of liquid argon using DEAP-3600 at SNOLAB

Ajaj, R.;Amaudruz, P. -A.;Araujo, G.  R.;Baldwin, M.;Batygov, M.;Beltran, B.;Bina, C.  E.;Bonatt, J.;Boulay, M.  G.;Broerman, B.;Bueno, J.  F.;Burghardt, P.  M.;Butcher, A.;Cai, B.;Cavuoti, S.;Chen, M.;Chen, Y.;Cleveland, B.  T.;Cranshaw, D.;Dering, K.;DiGioseffo, J.;Doria, L.;Duncan, F.  A.;Dunford, M.;Erlandson, A.;Fatemighomi, N.;Fiorillo, G.;Florian, S.;Flower, A.;Ford, R.  J.;Gagnon, R.;Gallacher, D.;Garcés, E.  A.;Garg, S.;Giampa, P.;Goeldi, D.;Golovko, V.  V.;Gorel, P.;Graham, K.;Grant, D.  R.;Hallin, A.  L.;Hamstra, M.;Harvey, P.  J.;Hearns, C.;Joy, A.;Jillings, C.  J.;Kamaev, O.;Kaur, G.;Kemp, A.;Kochanek, I.;Kuźniak, M.;Langrock, S.;La Zia, F.;Lehnert, B.;Li, X.;Lidgard, J.;Lindner, T.;Litvinov, O.;Lock, J.;Longo, G.;Majewski, P.;McDonald, A.  B.;McElroy, T.;McGinn, T.;McLaughlin, J.  B.;Mehdiyev, R.;Mielnichuk, C.;Monroe, J.;Nadeau, P.;Nantais, C.;Ng, C.;Noble, A.  J.;O’Dwyer, E.;Ouellet, C.;Pasuthip, P.;Peeters, S.  J.  M.;Piro, M. -C.;Pollmann, T.  R.;Rand, E.  T.;Rethmeier, C.;Retière, F.;Seeburn, N.;Singhrao, K.;Skensved, P.;Smith, B.;Smith, N.  J.  T.;Sonley, T.;Soukup, J.;Stainforth, R.;Stone, C.;Strickland, V.;Sur, B.;Tang, J.;Vázquez-Jáuregui, E.;Veloce, L.;Viel, S.;Walding, J.;Waqar, M.;Ward, M.;Westerdale, S.;Willis, J.;Zuñiga-Reyes, A.

2019