A method for the array characterization from Near-Field measurements is here presented. The method exploit the concept of Singular-Value Optimization to dramatically reduce the number of data needed by a complete mapping of the excitations. The approach is here applied to a planar scanning and numerically validated. © 2017 Euraap.
SVO in array diagnostic for the planar near-field scanning / Capozzoli, Amedeo; Curcio, Claudio; Liseno, Angelo. - (2017), pp. 393-397. (Intervento presentato al convegno 11th European Conference on Antennas and Propagation (EUCAP), 2017 tenutosi a Paris nel 19-24 March 2017) [10.23919/EuCAP.2017.7928644].
SVO in array diagnostic for the planar near-field scanning
CAPOZZOLI, AMEDEO;CURCIO, CLAUDIO;LISENO, ANGELO
2017
Abstract
A method for the array characterization from Near-Field measurements is here presented. The method exploit the concept of Singular-Value Optimization to dramatically reduce the number of data needed by a complete mapping of the excitations. The approach is here applied to a planar scanning and numerically validated. © 2017 Euraap.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
