This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.
A novel method for SEE validation of complex SoCs using Low-Energy Proton beams / DI CAPUA, Francesco; Furano, G. A; Di Mascio, S. B; Szewczyk, T. A; Menicucci, A. C; Campajola, Luigi; Fabbri, A. E; Ottavi, M. B.. - (2016), pp. 131-134. (Intervento presentato al convegno 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 tenutosi a United States nel October 2016) [10.1109/DFT.2016.7684084].
A novel method for SEE validation of complex SoCs using Low-Energy Proton beams
DI CAPUA, FRANCESCO;CAMPAJOLA, LUIGI;
2016
Abstract
This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.