The electrical properties of two cold-shrink stress control tube based on ethylene propylene diene monomer (EPDM) and silicon rubber were analyzed to determine the suitable expressions for the electrical parameters to be used in numerical programs. The influence of the polymeric matrix, the elastic deformation due to the different shrinkage diameter and temperature on the properties of the materials were considered. The elastic deformation induced by the different shrinkage diameter produced some modifications especially in the characteristics of EPDM based composites. A non-monotonic behaviour of either the resistivity or the permittivity versus the shrinkage diameter was shown for these materials.

Effect of thermal and mechanical stresses on the electrical properties of stress grading materials / L., Egiziano; V., Tucci; Petrarca, Carlo; M., Vitelli. - STAMPA. - (1998), pp. 553-556. (Intervento presentato al convegno International Conference on Conduction and Breakdown in Solid Dielectrics (ICSD) tenutosi a Vasteras, Sweden nel 22-25 giugno 1998) [10.1109/ICSD.1998.709345].

Effect of thermal and mechanical stresses on the electrical properties of stress grading materials

PETRARCA, CARLO;
1998

Abstract

The electrical properties of two cold-shrink stress control tube based on ethylene propylene diene monomer (EPDM) and silicon rubber were analyzed to determine the suitable expressions for the electrical parameters to be used in numerical programs. The influence of the polymeric matrix, the elastic deformation due to the different shrinkage diameter and temperature on the properties of the materials were considered. The elastic deformation induced by the different shrinkage diameter produced some modifications especially in the characteristics of EPDM based composites. A non-monotonic behaviour of either the resistivity or the permittivity versus the shrinkage diameter was shown for these materials.
1998
0780342372
Effect of thermal and mechanical stresses on the electrical properties of stress grading materials / L., Egiziano; V., Tucci; Petrarca, Carlo; M., Vitelli. - STAMPA. - (1998), pp. 553-556. (Intervento presentato al convegno International Conference on Conduction and Breakdown in Solid Dielectrics (ICSD) tenutosi a Vasteras, Sweden nel 22-25 giugno 1998) [10.1109/ICSD.1998.709345].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/517227
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