In order to investigate the possibility of using superconducting cables in power transmission lines, a problem to be solved is that of the diagnostics to be performed to assure the safe operation of the whole system. Partial discharge diagnostics is a valuable tool in order to assess the reliability of HV apparatus. In this work AC partial discharge characterization has been carried out on an experimental set-up for testing an HV superconducting model cable, including HV bushing and the impregnated paper insulation system. Special care has been dedicated to the characterization of the discharges and to the organization of experimental data in order to assess the validity of fingerprints as a diagnostic tool for the recognition and location of defects and study their role on the breakdown and aging of the device.
Partial discharge diagnostics on a HV superconducting model cable / Lupo', Giovanni; Petrarca, Carlo; L., Egiziano; V., Tucci; M., Vitelli. - STAMPA. - 1:(1997), pp. 346-349. (Intervento presentato al convegno Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) tenutosi a Minneapolis, USA nel 19-22 ottobre 1997) [10.1109/CEIDP.1997.634629].
Partial discharge diagnostics on a HV superconducting model cable
LUPO', GIOVANNI;PETRARCA, CARLO;
1997
Abstract
In order to investigate the possibility of using superconducting cables in power transmission lines, a problem to be solved is that of the diagnostics to be performed to assure the safe operation of the whole system. Partial discharge diagnostics is a valuable tool in order to assess the reliability of HV apparatus. In this work AC partial discharge characterization has been carried out on an experimental set-up for testing an HV superconducting model cable, including HV bushing and the impregnated paper insulation system. Special care has been dedicated to the characterization of the discharges and to the organization of experimental data in order to assess the validity of fingerprints as a diagnostic tool for the recognition and location of defects and study their role on the breakdown and aging of the device.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
