In this paper the principal and more important application of Infrared Thermography are discussed. In particular the application of this experimental technique, both in its transient and steady-state mode of operation, are reported and illustrated through a broad set of experiments and examples. Functional application to the characterization of VLSI devices, application to the failure analysis of large area power devices, current monitoring in state-of-art heterojunction and organic devices prove the high potential of this technique.
Infrared Thermography application to functional and failure analysis of electron devices and circuits / Irace, Andrea. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 52:9-10(2012), pp. 2019-2023. [10.1016/j.microrel.2012.06.106]
Infrared Thermography application to functional and failure analysis of electron devices and circuits
IRACE, ANDREA
2012
Abstract
In this paper the principal and more important application of Infrared Thermography are discussed. In particular the application of this experimental technique, both in its transient and steady-state mode of operation, are reported and illustrated through a broad set of experiments and examples. Functional application to the characterization of VLSI devices, application to the failure analysis of large area power devices, current monitoring in state-of-art heterojunction and organic devices prove the high potential of this technique.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.