The recent research on metrological testing of analog-to-digital converter-based measuring devices is analysed with the twofold aims of focusing both the contemporary situation and the imminent trends. Testing techniques are classified according to their dependence or not by the device architecture. In the former case, the studies on the most common dynamic tests, such as sine-fit, histogram, spectral analysis, and time base tests, are discussed. In the latter case, the research activities on the two extreme architectures with very-high resolution and very-high real-time sampling frequency are reviewed.
Metrological characterisation of analog-to-digital converters - a state of the art / Arpaia, Pasquale; Cennamo, Felice; P., Daponte. - STAMPA. - (1999), pp. 134-144. (Intervento presentato al convegno 1999 3rd International Conference on Advanced A/D and D/A Conversionn Techniques and Their Applications tenutosi a Glasgow, UK nel 27-28/07/1999).
Metrological characterisation of analog-to-digital converters - a state of the art
ARPAIA, PASQUALE;CENNAMO, FELICE;
1999
Abstract
The recent research on metrological testing of analog-to-digital converter-based measuring devices is analysed with the twofold aims of focusing both the contemporary situation and the imminent trends. Testing techniques are classified according to their dependence or not by the device architecture. In the former case, the studies on the most common dynamic tests, such as sine-fit, histogram, spectral analysis, and time base tests, are discussed. In the latter case, the research activities on the two extreme architectures with very-high resolution and very-high real-time sampling frequency are reviewed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
