The double coincidence probability is a well known limitation to the rate capability of a 2-D detector with independent X- and Y-readout. The authors have implemented a parametric Monte Carlo simulation which could help in optimizing the double coincidence recovery. They have applied the parametric simulation to a specific 2-D solid state detector, they are developing for application in digital mammography

Photons counting of a 2D silicon μ-strip detector in high X-rays flux environment: double coincidences recovery / A., D.G., M., G., M., M., R., M., A., T., M. G., B., U., B., E., F., V., R., A. S. R., T., E., B., M., C., Russo, P., R., B.. - STAMPA. - 3:(1995), pp. 1642-1646. (1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record San Francisco, CA, USA 21-28/10/1995) [10.1109/NSSMIC.1995.500384].

Photons counting of a 2D silicon μ-strip detector in high X-rays flux environment: double coincidences recovery

RUSSO, PAOLO;
1995

Abstract

The double coincidence probability is a well known limitation to the rate capability of a 2-D detector with independent X- and Y-readout. The authors have implemented a parametric Monte Carlo simulation which could help in optimizing the double coincidence recovery. They have applied the parametric simulation to a specific 2-D solid state detector, they are developing for application in digital mammography
1995
078033180X
Photons counting of a 2D silicon μ-strip detector in high X-rays flux environment: double coincidences recovery / A., D.G., M., G., M., M., R., M., A., T., M. G., B., U., B., E., F., V., R., A. S. R., T., E., B., M., C., Russo, P., R., B.. - STAMPA. - 3:(1995), pp. 1642-1646. (1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record San Francisco, CA, USA 21-28/10/1995) [10.1109/NSSMIC.1995.500384].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/475545
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