In the framework of an experimental study of the possibility of using a double-sided silicon strip detector for digital radiography, and electronic system has been developed to make the signals coming from the two sides of the crystal coincide and hence to define the impact point of X-rays, giving an image matrix as final output. It is based on commercial PALs, and has been built and tested for 32×32 channels. In this configuration the dead time between two subsequent events is ⩽34 ns. Its logic is easily extendable to a large number of channels with a limited increase of the overall dead time and its various stages have been devised in view of a future integration as VLSI

An electronic coincidence system for 'in frame' DAQ from a double side mu -strip silicon detector exposed to X-rays / A., Bandettini; W., Bencivelli; Bertolucci, Ennio; U., Bottigli; Conti, Maurizio; A., Del Guerra; M. E., Fantacci; P., Randaccio; V., Rosso; Russo, Paolo; A., Stefanini. - STAMPA. - (1992), pp. 517-519. (Intervento presentato al convegno IEEE Conference on Nuclear Science Symposium and Medical Imaging tenutosi a Orlando, FL, USA nel 25-31/10/1992) [10.1109/NSSMIC.1992.301316].

An electronic coincidence system for 'in frame' DAQ from a double side mu -strip silicon detector exposed to X-rays

BERTOLUCCI, ENNIO;CONTI, MAURIZIO;RUSSO, PAOLO;
1992

Abstract

In the framework of an experimental study of the possibility of using a double-sided silicon strip detector for digital radiography, and electronic system has been developed to make the signals coming from the two sides of the crystal coincide and hence to define the impact point of X-rays, giving an image matrix as final output. It is based on commercial PALs, and has been built and tested for 32×32 channels. In this configuration the dead time between two subsequent events is ⩽34 ns. Its logic is easily extendable to a large number of channels with a limited increase of the overall dead time and its various stages have been devised in view of a future integration as VLSI
1992
0780308840
An electronic coincidence system for 'in frame' DAQ from a double side mu -strip silicon detector exposed to X-rays / A., Bandettini; W., Bencivelli; Bertolucci, Ennio; U., Bottigli; Conti, Maurizio; A., Del Guerra; M. E., Fantacci; P., Randaccio; V., Rosso; Russo, Paolo; A., Stefanini. - STAMPA. - (1992), pp. 517-519. (Intervento presentato al convegno IEEE Conference on Nuclear Science Symposium and Medical Imaging tenutosi a Orlando, FL, USA nel 25-31/10/1992) [10.1109/NSSMIC.1992.301316].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/472996
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