In this paper we report on the frequency dependence of the AC conductivity of porous silicon in the range 10 Hz-100 kHz. Two types of testing devices have been fabricated on three different series of samples formed electrochemically using as a starting material p-type, n(-)-type and n(+)-type silicon substrates. For frequencies less than 20-40 kHz the conductivity is found to follow a sublinear frequency dependence. This behaviour is typical of a carrier transport mechanism determined by an anomalous diffusion process. At higher frequencies me find that sm face states influence the transport mechanism. This suggests a double-channel transport mechanism: one related to porous-silicon ''volume'' properties and the other more connected to the ''surface'', itself.

AC conductivity of porous silicon: A fractal and surface transport mechanism? / Di Francia, G.; La Ferrara, V.; Maddalena, Pasqualino; Ninno, Domenico; Odierna, L. P.; Cataudella, Vittorio. - In: NUOVO CIMENTO DELLA SOCIETÀ ITALIANA DI FISICA. D CONDENSED MATTER, ATOMIC, MOLECULAR AND CHEMICAL PHYSICS, BIOPHYSICS. - ISSN 0392-6737. - STAMPA. - 18:(1996), pp. 1187-1196. [10.1007/BF02464696]

AC conductivity of porous silicon: A fractal and surface transport mechanism?

MADDALENA, PASQUALINO;NINNO, DOMENICO;CATAUDELLA, VITTORIO
1996

Abstract

In this paper we report on the frequency dependence of the AC conductivity of porous silicon in the range 10 Hz-100 kHz. Two types of testing devices have been fabricated on three different series of samples formed electrochemically using as a starting material p-type, n(-)-type and n(+)-type silicon substrates. For frequencies less than 20-40 kHz the conductivity is found to follow a sublinear frequency dependence. This behaviour is typical of a carrier transport mechanism determined by an anomalous diffusion process. At higher frequencies me find that sm face states influence the transport mechanism. This suggests a double-channel transport mechanism: one related to porous-silicon ''volume'' properties and the other more connected to the ''surface'', itself.
1996
AC conductivity of porous silicon: A fractal and surface transport mechanism? / Di Francia, G.; La Ferrara, V.; Maddalena, Pasqualino; Ninno, Domenico; Odierna, L. P.; Cataudella, Vittorio. - In: NUOVO CIMENTO DELLA SOCIETÀ ITALIANA DI FISICA. D CONDENSED MATTER, ATOMIC, MOLECULAR AND CHEMICAL PHYSICS, BIOPHYSICS. - ISSN 0392-6737. - STAMPA. - 18:(1996), pp. 1187-1196. [10.1007/BF02464696]
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/470441
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1
  • ???jsp.display-item.citation.isi??? 11
social impact