The reconstruction of the dielectric permittivity profile from scattered field measurements in two dimensions is addressed in free space under the Born approximation. Canonical geometries suitable for future extensions to subsurface sensing configurations are dealt with. In particular, a rectilinear measurement aperture located in the Fresnel zone and rectilinear investigation domains parallel or orthogonal to the measurement line are considered for the scalar e.m. case. Firstly, the dependence of both transversal and longitudinal resolution on the geometrical parameters of the sensing configuration is analytically worked out in only aspect diversity. Then, the effect of frequency diversity on depth-resolution is also pointed out.

Resolution Limits in the Fresnel Zone: Roles of Aperture and Frequency / R., Pierri; Liseno, Angelo; R., Solimene; F., Tartaglione; F., Soldovieri. - In: SUBSURFACE SENSING TECHNOLOGIES & APPLICATIONS. - ISSN 1566-0184. - 3:1(2002), pp. 1-18. [10.1023/A:1014003228400]

Resolution Limits in the Fresnel Zone: Roles of Aperture and Frequency

LISENO, ANGELO;
2002

Abstract

The reconstruction of the dielectric permittivity profile from scattered field measurements in two dimensions is addressed in free space under the Born approximation. Canonical geometries suitable for future extensions to subsurface sensing configurations are dealt with. In particular, a rectilinear measurement aperture located in the Fresnel zone and rectilinear investigation domains parallel or orthogonal to the measurement line are considered for the scalar e.m. case. Firstly, the dependence of both transversal and longitudinal resolution on the geometrical parameters of the sensing configuration is analytically worked out in only aspect diversity. Then, the effect of frequency diversity on depth-resolution is also pointed out.
2002
Resolution Limits in the Fresnel Zone: Roles of Aperture and Frequency / R., Pierri; Liseno, Angelo; R., Solimene; F., Tartaglione; F., Soldovieri. - In: SUBSURFACE SENSING TECHNOLOGIES & APPLICATIONS. - ISSN 1566-0184. - 3:1(2002), pp. 1-18. [10.1023/A:1014003228400]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/469027
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