In the standard version of the EGS4 code system, the equivalent K-edge of a compound is assumed to be the weighted average of the K-edge of each element in the compound. This implies that the energy of both the fluorescent photon and the photoelectron is not correct, hence inaccurate EGS4 simulations of energy scoring in the compound material may be produced in the low-energy range (10-100 keV). In this report we show a technique that we used to overcome this problem. The same technique can also be used to introduce L-edge sampling in EGS4. An application of this sampling method to HgI2 compound is shown.
A Simple Method To Introduce K-edge Sampling For Compounds In the Code Egs4 For X-ray Element Analysis / DEL GUERRA, Alberto; W. R., Nelson; Russo, Paolo. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - 359:(1991), pp. 378-385. [10.1016/0168-9002(95)00120-4]
A Simple Method To Introduce K-edge Sampling For Compounds In the Code Egs4 For X-ray Element Analysis
DEL GUERRA, ALBERTO;RUSSO, PAOLO
1991
Abstract
In the standard version of the EGS4 code system, the equivalent K-edge of a compound is assumed to be the weighted average of the K-edge of each element in the compound. This implies that the energy of both the fluorescent photon and the photoelectron is not correct, hence inaccurate EGS4 simulations of energy scoring in the compound material may be produced in the low-energy range (10-100 keV). In this report we show a technique that we used to overcome this problem. The same technique can also be used to introduce L-edge sampling in EGS4. An application of this sampling method to HgI2 compound is shown.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
