The switching process of a uniformly magnetized spin-valve is considered. The system is subject to external dc applied fields and injected radio-frequency (RF) spin-polarized currents. The possibility of using the RF power to obtain a reduced coercivity of the particle is related to the onset of chaotic magnetization dynamics for moderately low values of the RF current amplitude. Perturbation technique for the estimation of the reduced coercive field is developed and applied to the microwave assisted switching of the particle. Numerical simulations confirm the predictions of the theory. (C) 2011 American Institute of Physics. [doi:10.1063/1.3556701]

Current-driven chaotic magnetization dynamics in microwave assisted switching of spin-valve elements / M., D'Aquino; Fratta, G. D.; Serpico, Claudio; G., Bertotti; R., Bonin; I. D., Mayergoyz; D'Aquino, Massimiliano. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - ELETTRONICO. - 109:(2011), pp. 07D349-1-07D349-3. [10.1063/1.3556701]

Current-driven chaotic magnetization dynamics in microwave assisted switching of spin-valve elements

G. D. Fratta;SERPICO, CLAUDIO;D'AQUINO, MASSIMILIANO
2011

Abstract

The switching process of a uniformly magnetized spin-valve is considered. The system is subject to external dc applied fields and injected radio-frequency (RF) spin-polarized currents. The possibility of using the RF power to obtain a reduced coercivity of the particle is related to the onset of chaotic magnetization dynamics for moderately low values of the RF current amplitude. Perturbation technique for the estimation of the reduced coercive field is developed and applied to the microwave assisted switching of the particle. Numerical simulations confirm the predictions of the theory. (C) 2011 American Institute of Physics. [doi:10.1063/1.3556701]
2011
Current-driven chaotic magnetization dynamics in microwave assisted switching of spin-valve elements / M., D'Aquino; Fratta, G. D.; Serpico, Claudio; G., Bertotti; R., Bonin; I. D., Mayergoyz; D'Aquino, Massimiliano. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - ELETTRONICO. - 109:(2011), pp. 07D349-1-07D349-3. [10.1063/1.3556701]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/430635
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