FPGA testing poses a number of challenges related to both the complexity of the device under test and the opportunities introduced by its support to hardware reconfiguration. Application-dependent testing (ADT) provides an effective answer to these challenges. The study presented in this paper identifies some limitations of state-of-the-art ADT approaches, which prevent a complete coverage for bridging faults and the practical applicability of the algorithms for test configuration generation. The work also introduces a set of new techniques that enabled us to overcome these limitations and effectively extend previous methodologies for ADT.
Revisiting Application-Dependent Test for FPGA Devices / Cilardo, Alessandro; Lofiego, Carmelo; Mazzeo, Antonino; Mazzocca, Nicola. - (2011), pp. 213-213. (Intervento presentato al convegno 16th IEEE European Test Symposium (ETS), 2011 tenutosi a Trondheim nel 23-27 Maggio 2011) [10.1109/ETS.2011.54].
Revisiting Application-Dependent Test for FPGA Devices
CILARDO, Alessandro;LOFIEGO, CARMELO;MAZZEO, ANTONINO;MAZZOCCA, NICOLA
2011
Abstract
FPGA testing poses a number of challenges related to both the complexity of the device under test and the opportunities introduced by its support to hardware reconfiguration. Application-dependent testing (ADT) provides an effective answer to these challenges. The study presented in this paper identifies some limitations of state-of-the-art ADT approaches, which prevent a complete coverage for bridging faults and the practical applicability of the algorithms for test configuration generation. The work also introduces a set of new techniques that enabled us to overcome these limitations and effectively extend previous methodologies for ADT.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
