We present an innovative Near-Field test range, named Compact Near-Field (CNF) test range, using photonic probes and advanced Near-Field Far-Field transformations (NFFF). The photonic probe allows distances of one wavelength or less between AUT and probe, drastically reducing test range and scanner dimensions, improving the Signal to Clutter Ratio and the Signal to Noise Ratio, and reducing the scanning area and time. The NFFF, properly formulated as a linear inverse problem, further improves the rejection to clutter, noise and truncation error. The advantages of CNF test ranges are numerically foreseen and experimental results are presented under both, planar and cylindrical scanning geometries.

Dielectric probes, compact near-field and advanced near-field far-field techniques / Capozzoli, Amedeo; Curcio, Claudio; D'Elia, Giuseppe; Liseno, Angelo; Vinetti, Pietro; K., Koumiyama; M., Hirose; M., Ameya; S., Kurokawa. - ELETTRONICO. - (2009), pp. 1-6. (Intervento presentato al convegno 30th Annual Antenna Measurem. Tech. Ass. Symp. tenutosi a Salt Lake City, USA nel Nov. 1-6, 2009).

Dielectric probes, compact near-field and advanced near-field far-field techniques

CAPOZZOLI, AMEDEO;CURCIO, CLAUDIO;D'ELIA, GIUSEPPE;LISENO, ANGELO;VINETTI, PIETRO;
2009

Abstract

We present an innovative Near-Field test range, named Compact Near-Field (CNF) test range, using photonic probes and advanced Near-Field Far-Field transformations (NFFF). The photonic probe allows distances of one wavelength or less between AUT and probe, drastically reducing test range and scanner dimensions, improving the Signal to Clutter Ratio and the Signal to Noise Ratio, and reducing the scanning area and time. The NFFF, properly formulated as a linear inverse problem, further improves the rejection to clutter, noise and truncation error. The advantages of CNF test ranges are numerically foreseen and experimental results are presented under both, planar and cylindrical scanning geometries.
2009
Dielectric probes, compact near-field and advanced near-field far-field techniques / Capozzoli, Amedeo; Curcio, Claudio; D'Elia, Giuseppe; Liseno, Angelo; Vinetti, Pietro; K., Koumiyama; M., Hirose; M., Ameya; S., Kurokawa. - ELETTRONICO. - (2009), pp. 1-6. (Intervento presentato al convegno 30th Annual Antenna Measurem. Tech. Ass. Symp. tenutosi a Salt Lake City, USA nel Nov. 1-6, 2009).
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/368188
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact