IRIS

A benchmark study on the thermal conductivity of nanofluids / Jacopo, Buongiorno; David C., Venerus; Naveen, Prabhat; Thomas, Mckrell; Jessica, Townsend; Rebecca, Christianson; Yuriy V., Tolmachev; Pawel, Keblinski; Lin wen, Hu; Jorge L., Alvarado; In Cheol, Bang; Sandra W., Bishnoi; Marco, Bonetti; Frank, Botz; Cecere, Anselmo; Yun, Chang; Gang, Chen; Haisheng, Chen; Sung Jae, Chung; Minking K., Chyu; Sarit K., Das; Roberto Di, Paola; Yulong, Ding; Frank, Dubois; Grzegorz, Dzido; Jacob, Eapen; Werner, Escher; Denis, Funfschilling; Quentin, Galand; Jinwei, Gao; Patricia E., Gharagozloo; Kenneth E., Goodson; Jorge Gustavo, Gutierrez; Haiping, Hong; Mark, Horton; Kyo Sik, Hwang; Carlo S., Iorio; Seok Pil, Jang; Andrzej B., Jarzebski; Yiran, Jiang; Liwen, Jin; Stephan, Kabelac; Aravind, Kamath; Mark A., Kedzierski; Lim Geok, Kieng; Chongyoup, Kim; Ji Hyun, Kim; Seokwon, Kim; Seung Hyun, Lee; Kai Choong, Leong; Indranil, Manna; Bruno, Michel; Rui, Ni; Hrishikesh E., Patel; John, Philip; Dimos, Poulikakos; Cecile, Reynaud; Savino, Raffaele; Pawan K., Singh; Pengxiang, Song; Thirumalachari, Sundararajan; Elena, Timofeeva; Todd, Tritcak; Aleksandr N., Turanov; Stefan Van, Vaerenbergh; Dongsheng, Wen; Sanjeeva, Witharana; Chun, Yang; Wei Hsun, Yeh; Xiao Zheng, Zhao; Sheng Qi, Zhou. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - ELETTRONICO. - 106:9(2009), pp. 094312-094326. [10.1063/1.3245330]

A benchmark study on the thermal conductivity of nanofluids

CECERE, ANSELMO;SAVINO, RAFFAELE;
2009
2009
A benchmark study on the thermal conductivity of nanofluids / Jacopo, Buongiorno; David C., Venerus; Naveen, Prabhat; Thomas, Mckrell; Jessica, Townsend; Rebecca, Christianson; Yuriy V., Tolmachev; Pawel, Keblinski; Lin wen, Hu; Jorge L., Alvarado; In Cheol, Bang; Sandra W., Bishnoi; Marco, Bonetti; Frank, Botz; Cecere, Anselmo; Yun, Chang; Gang, Chen; Haisheng, Chen; Sung Jae, Chung; Minking K., Chyu; Sarit K., Das; Roberto Di, Paola; Yulong, Ding; Frank, Dubois; Grzegorz, Dzido; Jacob, Eapen; Werner, Escher; Denis, Funfschilling; Quentin, Galand; Jinwei, Gao; Patricia E., Gharagozloo; Kenneth E., Goodson; Jorge Gustavo, Gutierrez; Haiping, Hong; Mark, Horton; Kyo Sik, Hwang; Carlo S., Iorio; Seok Pil, Jang; Andrzej B., Jarzebski; Yiran, Jiang; Liwen, Jin; Stephan, Kabelac; Aravind, Kamath; Mark A., Kedzierski; Lim Geok, Kieng; Chongyoup, Kim; Ji Hyun, Kim; Seokwon, Kim; Seung Hyun, Lee; Kai Choong, Leong; Indranil, Manna; Bruno, Michel; Rui, Ni; Hrishikesh E., Patel; John, Philip; Dimos, Poulikakos; Cecile, Reynaud; Savino, Raffaele; Pawan K., Singh; Pengxiang, Song; Thirumalachari, Sundararajan; Elena, Timofeeva; Todd, Tritcak; Aleksandr N., Turanov; Stefan Van, Vaerenbergh; Dongsheng, Wen; Sanjeeva, Witharana; Chun, Yang; Wei Hsun, Yeh; Xiao Zheng, Zhao; Sheng Qi, Zhou. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - ELETTRONICO. - 106:9(2009), pp. 094312-094326. [10.1063/1.3245330]
1.1 Articolo in rivista
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/360465
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 1067
  • ???jsp.display-item.citation.isi??? 994
social impact