A simple technique for the growth of SrO-terminated SrTiO3 surfaces is reported. High quality SrTiO3 epitaxial films were grown by reflection high energy electron diffraction assisted pulsed laser deposition on suitably prepared NdGaO3 110 substrates. The surface properties, analyzed within a growth/characterization multichamber ultrahigh vacuum system by photoemission spectroscopy performed on the core-level spectra of Sr and Ti, low energy electron diffraction-, scanning tunneling-, and atomic force microscopy, are fully consistent with a single Sr oxide termination. The availability of such high quality SrO-terminated SrTiO3 surfaces is of major importance for the controlled growth of oxide epilayers and interfaces.

Growth and characterization of stable SrO-terminated SrTiO3 surfaces / M., Radovic; N., Lampis; F., Miletto Granozio; P., Perna; Z., Ristic; M., Salluzzo; C. M., Schlepütz; SCOTTI DI UCCIO, Umberto. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 94:(2009), pp. 022901-022903. [10.1063/1.305260]

Growth and characterization of stable SrO-terminated SrTiO3 surfaces

SCOTTI DI UCCIO, UMBERTO
2009

Abstract

A simple technique for the growth of SrO-terminated SrTiO3 surfaces is reported. High quality SrTiO3 epitaxial films were grown by reflection high energy electron diffraction assisted pulsed laser deposition on suitably prepared NdGaO3 110 substrates. The surface properties, analyzed within a growth/characterization multichamber ultrahigh vacuum system by photoemission spectroscopy performed on the core-level spectra of Sr and Ti, low energy electron diffraction-, scanning tunneling-, and atomic force microscopy, are fully consistent with a single Sr oxide termination. The availability of such high quality SrO-terminated SrTiO3 surfaces is of major importance for the controlled growth of oxide epilayers and interfaces.
2009
Growth and characterization of stable SrO-terminated SrTiO3 surfaces / M., Radovic; N., Lampis; F., Miletto Granozio; P., Perna; Z., Ristic; M., Salluzzo; C. M., Schlepütz; SCOTTI DI UCCIO, Umberto. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 94:(2009), pp. 022901-022903. [10.1063/1.305260]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/342194
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