The director tilt angle distribution in vertically aligned nematic liquid crystal displays has been investigated by means of variable angle spectroscopic ellipsometry. Liquid crystal vertical alignment has been realized by thermal evaporation of SiOx. By changing the deposition angle, it is possible to control the pretilt angle. The director profile inside the sample was inferred by reflection and transmission ellipsometric measurements. The tilt angle distribution inside the cell versus the applied voltage is reported and eventually, comparing it with the simulations from the elastic theory, the anchoring energy has been obtained.
Ellipsometric study of vertically aligned liquid crystals / Marino, Antigone; Santamato, Enrico; N., Bennis; X., Quintana; J. M., Otón; V., Tkachenko; Abbate, Giancarlo. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - STAMPA. - 39:(2009), pp. 013508-1-013508-3. [10.1063/1.3064131]
Ellipsometric study of vertically aligned liquid crystals
MARINO, Antigone;SANTAMATO, ENRICO;ABBATE, GIANCARLO
2009
Abstract
The director tilt angle distribution in vertically aligned nematic liquid crystal displays has been investigated by means of variable angle spectroscopic ellipsometry. Liquid crystal vertical alignment has been realized by thermal evaporation of SiOx. By changing the deposition angle, it is possible to control the pretilt angle. The director profile inside the sample was inferred by reflection and transmission ellipsometric measurements. The tilt angle distribution inside the cell versus the applied voltage is reported and eventually, comparing it with the simulations from the elastic theory, the anchoring energy has been obtained.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
