The achievable depth resolution in reconstructing the permittivity profile of a dielectric strip under the Born approximation when data are collected in the Fresnel zone is studied. We consider a rectilinear measurement aperture and an orthogonal and centered rectilinear investigation domain. The roles of the aperture extent and frequency diversity are highlighted.
In-depth resolution from multifrequency Born fields scattered by a dielectric strip in the Fresnel zone / Pierri, R; Liseno, Angelo; Solimene, R; Tartaglione, F.. - In: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION. - ISSN 1084-7529. - STAMPA. - 19:6(2002), pp. 1234-1238. [10.1364/JOSAA.19.001234]
In-depth resolution from multifrequency Born fields scattered by a dielectric strip in the Fresnel zone
LISENO, ANGELO;
2002
Abstract
The achievable depth resolution in reconstructing the permittivity profile of a dielectric strip under the Born approximation when data are collected in the Fresnel zone is studied. We consider a rectilinear measurement aperture and an orthogonal and centered rectilinear investigation domain. The roles of the aperture extent and frequency diversity are highlighted.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
