The Log-logistic model for reliability characterization of power system components subjected to random stress / Chiodo, E., G., M.. - ELETTRONICO. - Proceedings of SPEEDAM 2004, International Symposium on Power Electronics, Electrical Drives, Automation and Motion:(2004), pp. 239-244. (SPEEDAM 2004, International Symposium on Power Electronics, Electrical Drives, Automation and Motion Capri (Italy), ).
The Log-logistic model for reliability characterization of power system components subjected to random stress
CHIODO, ELIO;
2004
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