A model of a new technique to measure the spatial distribution of the majority and minority carrier lifetime along epilayers is presented.

AN ANALYTICAL MODEL OF AN OCVD-BASED MEASUREMENT TECHNIQUE OF THE LOCAL CARRIER LIFETIME / Bellone, S; Licciardo, G; Guerriero, Gabriele; Rubino, A.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - (2007), pp. 2998-3006.

AN ANALYTICAL MODEL OF AN OCVD-BASED MEASUREMENT TECHNIQUE OF THE LOCAL CARRIER LIFETIME

GUERRIERO, GABRIELE;
2007

Abstract

A model of a new technique to measure the spatial distribution of the majority and minority carrier lifetime along epilayers is presented.
2007
AN ANALYTICAL MODEL OF AN OCVD-BASED MEASUREMENT TECHNIQUE OF THE LOCAL CARRIER LIFETIME / Bellone, S; Licciardo, G; Guerriero, Gabriele; Rubino, A.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - STAMPA. - (2007), pp. 2998-3006.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11588/105284
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